In situsynchrotron X-ray diffraction study of coherently embedded silver nanostructure growth in silicon

CrystEngComm ◽  
2017 ◽  
Vol 19 (45) ◽  
pp. 6811-6820 ◽  
Author(s):  
Puspendu Guha ◽  
Raghavendra Rao Juluri ◽  
Anjan Bhukta ◽  
Arnab Ghosh ◽  
Santanu Maiti ◽  
...  

We report on thein situgrowth of coherently embedded Ag nanostructures using real time temperature dependent synchrotron X-ray diffraction (XRD) measurements.

2012 ◽  
Vol 51 (22) ◽  
pp. 12540-12547 ◽  
Author(s):  
Mark Feyand ◽  
Annika Hübner ◽  
André Rothkirch ◽  
David S. Wragg ◽  
Norbert Stock

Polymer ◽  
1995 ◽  
Vol 36 (13) ◽  
pp. 2667-2670 ◽  
Author(s):  
M.E. Vickers ◽  
H. Fischer

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