In situsynchrotron X-ray diffraction study of coherently embedded silver nanostructure growth in silicon
Keyword(s):
X Ray
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We report on thein situgrowth of coherently embedded Ag nanostructures using real time temperature dependent synchrotron X-ray diffraction (XRD) measurements.
1996 ◽
Vol 92
(7)
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pp. 1277
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Keyword(s):
1996 ◽
Vol 92
(22)
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pp. 4657
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Keyword(s):
2018 ◽
Vol 265
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pp. 162-171
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