Optical and electrical characterization of electrospun Al-doped zinc oxide nanofibers as transparent electrodes

2016 ◽  
Vol 4 (32) ◽  
pp. 7649-7657 ◽  
Author(s):  
Yu-Yu Cho ◽  
Changshu Kuo
Keyword(s):  
Zinc Oxide ◽  
Electrical Characterization ◽  
Transparent Electrode ◽  
Transparent Electrodes

Electrospun AZO nanofibers with precise controls of compositions, fiber diameters and fiber depositions for transparent electrode applications.

Electrical characterization of solar sensitive zinc oxide doped-amorphous carbon photodiode

Optik ◽  
2019 ◽  
Vol 178 ◽  
pp. 316-326 ◽  
Author(s):  
Mümin Mehmet Koç ◽  
Naim Aslan ◽  
Mustafa Erkovan ◽  
Bünyamin Aksakal ◽  
Orhan Uzun ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Amorphous Carbon ◽  
Electrical Characterization

Nonlinear Current-Voltage Characteristics of Homojunctions Made by Zinc Oxide Single Crystals

1996 ◽  
Vol 458 ◽  
Author(s):  
Takeshi Harada ◽  
Yoshinobu Nakamura ◽  
Akira Kishimoto ◽  
Naobumi Motohira ◽  
Hiroaki Yanagida
Keyword(s):  
Zinc Oxide ◽  
Single Crystals ◽  
Electrical Characterization ◽  
Earth Metal ◽  
Chemical Vapor ◽  
Current Voltage ◽  
Zno Varistors ◽  
Zno Crystal ◽  
Single Boundary

ABSTRACTZinc oxide (ZnO) single crystals are grown by the traditional chemical vapor reaction method and ZnO crystal pairs with a single boundary are successfully obtained. The obtained specimens with one ZnO–ZnO boundary (ZnO homojunction) show nonlinear current-voltage (I–V) characteristics without the addition of Bi2O3, CoO, MnO2, and/or rare earth metal oxides. A specimen with higher breakdown voltage shows superior nonlinearity with negative resistivity in its I–V characteristics. Electrical characterization of the ZnO homojunction is conducted and extremely slow response with the current (or voltage) stress is confirmed. The phenomenon had never been observed in commercial ZnO varistors. The surface temperature of the ZnO homojunction is enhanced by larger applied current. The effect of the Joule heat on the nonlinearity in the I–V curves of the ZnO homojunction is discussed.

Temperature-Dependent Electrical Characterization of Amorphous Indium Zinc Oxide Thin-Film Transistors

2017 ◽  
Vol 64 (8) ◽  
pp. 3183-3188 ◽  
Author(s):  
Keun Heo ◽  
Kyung-Sang Cho ◽  
Jun Young Choi ◽  
Sangmin Han ◽  
Yun Seop Yu ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Electrical Characterization ◽  
Oxide Thin Film ◽  
Zinc Oxide Thin Film ◽  
Temperature Dependent ◽  
Indium Zinc Oxide

Synthesis and optelectronic characterization of gallium doped zinc oxide transparent electrodes

1996 ◽  
Vol 288 (1-2) ◽  
pp. 29-31 ◽  
Author(s):  
G.A. Hirata ◽  
J. McKittrick ◽  
T. Cheeks ◽  
J.M. Siqueiros ◽  
J.A. Diaz ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Transparent Electrodes

scholarly journals Charge transport in nanoparticular thin films of zinc oxide and aluminum-doped zinc oxide

2015 ◽  
Vol 3 (7) ◽  
pp. 1468-1472 ◽  
Author(s):  
Thomas Lenz ◽  
Moses Richter ◽  
Gebhard J. Matt ◽  
Norman A. Luechinger ◽  
Samuel C. Halim ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Charge Transport ◽  
Electrical Characterization ◽  
Temperature Dependent ◽  
Current Voltage ◽  
Aluminum Doped Zinc Oxide ◽  
Doped Zno

In this work, we report on the electrical characterization of nanoparticular thin films of zinc oxide and aluminum-doped ZnO. Temperature-dependent current–voltage measurements revealed that charge transport is well described by the Poole–Frenkel model.

Effects of Processing Parameters on Zinc Oxide Thin Films Prepared by Single Solution Deposition

MRS Advances ◽  
2016 ◽  
Vol 1 (47) ◽  
pp. 3199-3205
Author(s):  
Manuel F. Martinez ◽  
Shaimum Shahriar ◽  
Donato Kava ◽  
Cheik Sana ◽  
Vanessa Castaneda ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Zinc Oxide ◽  
Structural Properties ◽  
Sol Gel ◽  
Electrical Characterization ◽  
Processing Parameters ◽  
Atmospheric Conditions ◽  
Oxide Thin Films

ABSTRACTZinc oxide thin films were prepared via the sol-gel spin-coating method with the use of a spin processor. The film’s annealing parameters were varied to study their impact on the final film morphology and electrical properties. Characterization of the structural properties of the samples was carried on a X-ray diffractometer (XRD) and scanning electron microscopy. Electrical characterization was obtained with the use of a four point probe. Optical characterization of the samples was carried on a UV-Vis-NIR Spectrophotometer. Samples annealed under a cover are observed to have a higher transmission percentage on the visible light range while having a very small grain size and small relative resistivity. Samples annealed under standard atmospheric conditions show a larger grain size and resistivity, and correlated to it, a smaller transmission percentage. Samples annealed under vacuum prove to have a much more reduced optical, electrical, and structural properties when compared to the rest of the samples.

Electrical characterization of zinc oxide thin films by electrochemical capacitance–voltage profiling

2004 ◽  
Vol 84 (16) ◽  
pp. 3043-3045 ◽  
Author(s):  
X. Tang ◽  
A. Clauzonnier ◽  
H. I. Campbell ◽  
K. A. Prior ◽  
B. C. Cavenett
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Electrical Characterization ◽  
Oxide Thin Films ◽  
Electrochemical Capacitance ◽  
Capacitance Voltage
Sign in / Sign up

Export Citation Format

Share Document