scholarly journals Improved spatial resolution for spot sampling in thermal desorption atomic force microscopy – mass spectrometry via rapid heating functions

Nanoscale ◽  
2017 ◽  
Vol 9 (17) ◽  
pp. 5708-5717 ◽  
Author(s):  
Suhas Somnath ◽  
Stephen Jesse ◽  
Gary J. Van Berkel ◽  
Sergei V. Kalinin ◽  
Olga S. Ovchinnikova
Keyword(s):  
Mass Spectrometry ◽  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Thermal Desorption ◽  
Rapid Heating ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Sub-micron proximal probe thermal desorption and laser mass spectrometry on painting cross-sections

2014 ◽  
Vol 6 (22) ◽  
pp. 8940-8945 ◽  
Author(s):  
Shawn C. Owens ◽  
Jacob A. Berenbeim ◽  
Catherine Schmidt Patterson ◽  
Eoghan P. Dillon ◽  
M. S. de Vries
Keyword(s):  
Mass Spectrometry ◽  
Atomic Force Microscopy ◽  
Thermal Desorption ◽  
Cross Sections ◽  
Organic Dyes ◽  
Laser Mass Spectrometry ◽  
Force Microscopy ◽  
Atomic Force

Cross-sections containing organic dyes are used to demonstrate sub-micron atomic force microscopy thermal desorption (AFM-TD), followed by laser mass spectrometry.

scholarly journals Polymeric spatial resolution test patterns for mass spectrometry imaging using nano-thermal analysis with atomic force microscopy

2017 ◽  
Vol 31 (14) ◽  
pp. 1204-1210 ◽  
Author(s):  
Tamin Tai ◽  
Vilmos Kertesz ◽  
Ming-Wei Lin ◽  
Bernadeta R. Srijanto ◽  
Dale K. Hensley ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Thermal Analysis ◽  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Mass Spectrometry Imaging ◽  
Force Microscopy ◽  
Atomic Force

High-Spatial-Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Noncontact Atomic Force Microscopy

2008 ◽  
Vol 47 (7) ◽  
pp. 6085-6087 ◽  
Author(s):  
Daisuke Sawada ◽  
Takashi Namikawa ◽  
Masuhiro Hiragaki ◽  
Yoshiaki Sugimoto ◽  
Masayuki Abe ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Force Microscopy ◽  
Distance Analysis ◽  
Atomic Force ◽  
Topographic Imaging

Force dependences for the definition of the atomic force microscopy spatial resolution

1988 ◽  
Vol 132 (6-7) ◽  
pp. 354-358 ◽  
Author(s):  
Yu.N. Moiseev ◽  
V.M. Mostepanenko ◽  
V.I. Panov ◽  
I.Yu. Sokolov
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Definition Of

scholarly journals Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification

Nanophotonics ◽  
2019 ◽  
Vol 8 (10) ◽  
pp. 1659-1671
Author(s):  
Nusrat Jahan ◽  
Hanwei Wang ◽  
Shensheng Zhao ◽  
Arkajit Dutta ◽  
Hsuan-Kai Huang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Spatial Resolution ◽  
Optical Force ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recent Advances ◽  
Spectroscopic Information

AbstractScanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

scholarly journals Detection of hepatitis C virus core protein in serum by atomic force microscopy combined with mass spectrometry

2015 ◽  
pp. 1597 ◽  
Author(s):  
Ivan Shumov ◽  
Yuri Ivanov ◽  
Anna Kaysheva ◽  
Pavel Frantsuzov ◽  
Tatyana Pleshakova ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Atomic Force Microscopy ◽  
Hepatitis C Virus ◽  
Hepatitis C ◽  
Core Protein ◽  
Force Microscopy ◽  
Virus Core ◽  
Atomic Force
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