Novel in situ self-separation of a 2 in. free-standing m-plane GaN wafer from an m-plane sapphire substrate by HCl chemical reaction etching in hydride vapor-phase epitaxy
Keyword(s):
A 2 in.-diameter free-standing m-plane GaN wafer was fabricated through in situ self-separation from m-plane sapphire using HCl chemical reaction etching (HCRE) in hydride vapor-phase epitaxy (HVPE).
1999 ◽
Vol 38
(Part 2, No. 3A)
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pp. L217-L219
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2007 ◽
Vol 253
(18)
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pp. 7423-7428
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2006 ◽
Vol 35
(4)
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pp. 613-617
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2015 ◽
Vol 427
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pp. 99-103
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2001 ◽
Vol 45
(5)
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pp. 711-715
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