Sequence-dependent mechanical, photophysical and electrical properties of pi-conjugated peptide hydrogelators

2015 ◽  
Vol 3 (25) ◽  
pp. 6505-6514 ◽  
Author(s):  
Herdeline Ann M. Ardoña ◽  
Kalpana Besar ◽  
Matteo Togninalli ◽  
Howard E. Katz ◽  
John D. Tovar

An investigation of how systematic variation of peptide sequence influences the nanoscale and bulk properties of 1D-nanostructure forming peptide–π–peptide hydrogelators is reported herein.

1999 ◽  
Vol 5 (S2) ◽  
pp. 120-121
Author(s):  
D. A. Muller ◽  
T. Sorsch ◽  
S. Moccio ◽  
F. H. Baumann ◽  
K. Evans-Lutterodt ◽  
...  

The transistors planned for commercial use ten years from now in many electronic devices will have gate lengths shorter than 130 atoms, gate oxides thinner than 1.2 nm of SiO2 and clock speeds in excess of 10 GHz. It is now technologically possible to produce such transistors with gate oxides only 5 silicon atoms thick[l]. Since at least two of those 5 atoms are not in a local environment similar to either bulk Si or bulk SiO2, the properties of the interface are responsible for a significant fraction of the “bulk” properties of the gate oxide. However the physical (and especially their electrical) properties of the interfacial atoms are very different from .bulk Si or bulk SiO2. Further, roughness on an atomic scale can alter the leakage current by orders of magnitude.In our studies of such devices, we found that thermal oxidation tends to produce Si/SiO2 interfaces with 0.1-0.2 nm rms roughness.


1992 ◽  
Vol 279 ◽  
Author(s):  
Li Binbin ◽  
Tan Hui ◽  
Han Ying ◽  
Tao Wei ◽  
Lin Chenglu

ABSTRACTPolycrystalline MnNiCuFeO was implanted by B+, P+ and Si+ ion beams and thermally annealed. The structure and electrical properties of the sample were measured using SEM, Microprobe (MP), Low Frequency Impedance Analyzer (LFIA) and Spreading Resistance Probe (SRP). The results show that the resistance of grain boundaries is much higher than that of grains. The spreading resistance of the implanted samples is lower by factor of 2 than that of the unimplanted ones. The ratio of the real part Rs (grain effect) to imaginary part Xs (grain boundary effect) decreases with ion beam implantation. From these results, we came to the conclusion that the behavior of the grain boundaries is important to the bulk properties of polycrystalline MnNiCuFeO.


Geophysics ◽  
1981 ◽  
Vol 46 (7) ◽  
pp. 1057-1059 ◽  
Author(s):  
Morrel H. Cohen

We show that the electrical properties of an inhomogeneous material are invariant to the scale of the inhomogeneity at low frequencies when they are determined solely from local bulk properties, Thus the pore and grain sizes of rocks cannot be ascertained by low‐frequency conductivity and dielectric constant measurements.


2019 ◽  
Vol 16 (7) ◽  
pp. 3072-3082
Author(s):  
Mikiko Ueno ◽  
Satoshi Yamauchi ◽  
Daiki Kumekawa ◽  
Yuichi Yamasaki

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