An integrated system for field analysis of Cd(ii) and Pb(ii) via preconcentration using nano-TiO2/cellulose paper composite and subsequent detection with a portable X-ray fluorescence spectrometer

RSC Advances ◽  
2016 ◽  
Vol 6 (11) ◽  
pp. 9002-9006 ◽  
Author(s):  
Xiaofeng Lin ◽  
Shun-Xing Li ◽  
Feng-Ying Zheng
Keyword(s):  
Integrated System ◽  
Field Analysis ◽  
Nano Tio2 ◽  
X Ray ◽  
Cellulose Paper ◽  
Analytical System ◽  
Fluorescence Spectrometer

An integrative field analytical system was developed for the determination of Pb(ii) and Cd(ii).

Determination and Evaluation of Dead Time for X-Ray Fluorescence Spectrometer

2013 ◽  
Vol 544 ◽  
pp. 445-449
Author(s):  
Ran Yan ◽  
Yu Bing Liu ◽  
Ping Dai
Keyword(s):  
Dead Time ◽  
Practical Method ◽  
Spectral Lines ◽  
Fluorescence Detector ◽  
X Ray ◽  
Analyte Content ◽  
Pair Method ◽  
Fluorescence Spectrometer ◽  
Sample Ratio

When an X-ray photon which is generated by the sample enters into the detector, pulses can be produced and recorded. The detector is unable to respond to another photon that enters at the same time when a photon is being detected. The time that the detector takes to respond to a photon is regarded as dead time. For the x-ray fluorescence detector, the recorded count is less than the real count impulse due to dead time. Hence, to correct x-ray intensity of samples whose element content is vastly different, determination of dead time is necessary. In this paper, a new and complete way to determine dead time is proposed, which can be summarized as “intensity pair method”. Three “intensity pairs” were used for determining dead time, which were “intensity pair” of collimators (S2 and S4), “intensity pair” of spectral lines (Kα and Kβ) and “intensity pair” of beads with different flux-sample ratio (higher SH and lower SL analyte content in the beads). It comes to a conclusion that dead time obtained from “intensity pair” of beads is the most practical method for correcting X-ray fluorescence intensity. As for routine analysis, the dead time of proportional counter can be accurate to 1×10-9s, which can make intensity correction error less than 0.1%.

Measurement of Multilayer Film Thickness Using X-Ray Fluorescence Spectrometer

2017 ◽  
Vol 726 ◽  
pp. 85-89
Author(s):  
Lei Zhang ◽  
Man Li ◽  
Hai Jian Li ◽  
Xin Song
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Multilayer Film ◽  
Rapid Determination ◽  
Middle Layer ◽  
X Ray ◽  
Fundamental Parameters ◽  
Minimum Number ◽  
Fluorescence Spectrometer

Energy dispersive X-ray fluorescence spectrometry (EDXRF) allows a rapid determination of the concentration of elemental constituents or the thickness of thin film, it has been widely used in the industry of thin film thickness. But for multilayer film, especially the middle layer, with the absorption and enhance effect of other layers, the thickness and intensity of the middle layer is not a linear relationship. This paper reports a quantitative analysis of multilayer film thicknesses based on the use of EDXRF and fundamental parameters method. The thickness of multilayer film can be easily determined with the CTCFP software because it requires a minimum number of pure elementals only. Analysis of double-layer thin films using the CTCFP software shows that the inter-element and inter-layer X-ray absorptions and enhancements in a specimen have been determined properly. Results obtained on the standards confirmed the accuracy of the method.

Determination of water content in silica nanopowder using wavelength-dispersive X-ray fluorescence spectrometer

2011 ◽  
Vol 99 (2) ◽  
pp. 332-338 ◽  
Author(s):  
Yong Suk Choi ◽  
Jong-Yun Kim ◽  
Suk Bon Yoon ◽  
Kyuseok Song ◽  
Young Jin Kim
Keyword(s):  
Water Content ◽  
X Ray ◽  
Silica Nanopowder ◽  
Fluorescence Spectrometer
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