Determination of water content in silica nanopowder using wavelength-dispersive X-ray fluorescence spectrometer

2011 ◽  
Vol 99 (2) ◽  
pp. 332-338 ◽  
Author(s):  
Yong Suk Choi ◽  
Jong-Yun Kim ◽  
Suk Bon Yoon ◽  
Kyuseok Song ◽  
Young Jin Kim
Keyword(s):  
Water Content ◽  
X Ray ◽  
Silica Nanopowder ◽  
Fluorescence Spectrometer

Calculation of the X-ray powder reflection profiles of very small needle-like crystals. II. Quantitative results on eskisehir sepiolite fibers

1981 ◽  
Vol 14 (6) ◽  
pp. 451-454 ◽  
Author(s):  
A. Yücel ◽  
M. Rautureau ◽  
D. Tchoubar ◽  
C. Tchoubar
Keyword(s):  
Water Content ◽  
Calculation Method ◽  
Lattice Parameters ◽  
Boundary Effects ◽  
Cross Sectional ◽  
X Ray ◽  
Hydration State ◽  
Quantitative Results ◽  
Small Needle

A calculation method for the X-ray profiles from small, needle-like crystallites [Yücel, Rautureau, Tchoubar & Tchoubar (1980). J. Appl. Cryst. 13, 370–374] is applied to natural Eskisehir sepiolite mineral. By analysing the hk0 reflections, quantitative results are given on the average cross-sectional dimensions, their distribution, preferred directions of growth, lattice parameters, hydration state, and imperfections. Practical methods for the determination of the zeolitic water content and the importance of boundary effects are proposed.

Determination and Evaluation of Dead Time for X-Ray Fluorescence Spectrometer

2013 ◽  
Vol 544 ◽  
pp. 445-449
Author(s):  
Ran Yan ◽  
Yu Bing Liu ◽  
Ping Dai
Keyword(s):  
Dead Time ◽  
Practical Method ◽  
Spectral Lines ◽  
Fluorescence Detector ◽  
X Ray ◽  
Analyte Content ◽  
Pair Method ◽  
Fluorescence Spectrometer ◽  
Sample Ratio

When an X-ray photon which is generated by the sample enters into the detector, pulses can be produced and recorded. The detector is unable to respond to another photon that enters at the same time when a photon is being detected. The time that the detector takes to respond to a photon is regarded as dead time. For the x-ray fluorescence detector, the recorded count is less than the real count impulse due to dead time. Hence, to correct x-ray intensity of samples whose element content is vastly different, determination of dead time is necessary. In this paper, a new and complete way to determine dead time is proposed, which can be summarized as “intensity pair method”. Three “intensity pairs” were used for determining dead time, which were “intensity pair” of collimators (S2 and S4), “intensity pair” of spectral lines (Kα and Kβ) and “intensity pair” of beads with different flux-sample ratio (higher SH and lower SL analyte content in the beads). It comes to a conclusion that dead time obtained from “intensity pair” of beads is the most practical method for correcting X-ray fluorescence intensity. As for routine analysis, the dead time of proportional counter can be accurate to 1×10-9s, which can make intensity correction error less than 0.1%.

An integrated system for field analysis of Cd(ii) and Pb(ii) via preconcentration using nano-TiO2/cellulose paper composite and subsequent detection with a portable X-ray fluorescence spectrometer

RSC Advances ◽  
2016 ◽  
Vol 6 (11) ◽  
pp. 9002-9006 ◽  
Author(s):  
Xiaofeng Lin ◽  
Shun-Xing Li ◽  
Feng-Ying Zheng
Keyword(s):  
Integrated System ◽  
Field Analysis ◽  
Nano Tio2 ◽  
X Ray ◽  
Cellulose Paper ◽  
Analytical System ◽  
Fluorescence Spectrometer

An integrative field analytical system was developed for the determination of Pb(ii) and Cd(ii).

Measurement of Multilayer Film Thickness Using X-Ray Fluorescence Spectrometer

2017 ◽  
Vol 726 ◽  
pp. 85-89
Author(s):  
Lei Zhang ◽  
Man Li ◽  
Hai Jian Li ◽  
Xin Song
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Multilayer Film ◽  
Rapid Determination ◽  
Middle Layer ◽  
X Ray ◽  
Fundamental Parameters ◽  
Minimum Number ◽  
Fluorescence Spectrometer

Energy dispersive X-ray fluorescence spectrometry (EDXRF) allows a rapid determination of the concentration of elemental constituents or the thickness of thin film, it has been widely used in the industry of thin film thickness. But for multilayer film, especially the middle layer, with the absorption and enhance effect of other layers, the thickness and intensity of the middle layer is not a linear relationship. This paper reports a quantitative analysis of multilayer film thicknesses based on the use of EDXRF and fundamental parameters method. The thickness of multilayer film can be easily determined with the CTCFP software because it requires a minimum number of pure elementals only. Analysis of double-layer thin films using the CTCFP software shows that the inter-element and inter-layer X-ray absorptions and enhancements in a specimen have been determined properly. Results obtained on the standards confirmed the accuracy of the method.

Structure determination of anhydrous acid strontium oxalate by conventional X-ray powder diffraction

2001 ◽  
Vol 16 (4) ◽  
pp. 224-226 ◽  
Author(s):  
G. Vanhoyland ◽  
M. K. Van Bael ◽  
J. Mullens ◽  
L. C. Van Poucke
Keyword(s):  
Thermal Decomposition ◽  
Water Content ◽  
Powder Diffraction ◽  
Structure Determination ◽  
Two Dimensional ◽  
Unit Cell Parameters ◽  
X Ray ◽  
Cell Parameters ◽  
Corrected Data

The anhydrous acid strontium oxalate Sr(HC2O4)⋅½(C2O4) was obtained by thermal decomposition of the hydrated acid strontium oxalate Sr(HC2O4)⋅½(C2O4)⋅H2O. This non-hygroscopic compound crystallizes in the space group P 21/c (No. 14) with unit cell parameters: a=0.796 61(7) nm, b=0.9205(1) nm, c=0.731 98(8) nm, and β=102.104(8)°. Final refinement of the X-ray powder data yielded RB=3.2% and Rwp=11.1% (background-corrected data). In this structure, Sr is eight-fold coordinated by O. These polyhedra are connected together by edge-sharing to form two-dimensional (2D) layers along the bc-plane, which means that there is an increased dimensionality from 1D to 2D with decreasing water content of the acid oxalates.

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