Highly efficient NIR to visible upconversion in a ZnO:Er,Yb thin film deposited by a AACVD atmospheric pressure process

RSC Advances ◽  
2015 ◽  
Vol 5 (74) ◽  
pp. 60246-60253 ◽  
Author(s):  
R. Elleuch ◽  
R. Salhi ◽  
J.-L. Deschanvres ◽  
R. Maalej

A ZnO:Er,Yb hexagonal wurtzite phase structured thin film with highly efficient NIR to visible upconversion emissions.

Author(s):  
Hang Chen ◽  
Angjian Wu ◽  
Stéphanie Mathieu ◽  
Peihan Gao ◽  
Xiaodong Li ◽  
...  

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Maximilian Krause ◽  
Aleksandra Nikolaeva ◽  
Matthias Maiberg ◽  
Philip Jackson ◽  
Dimitrios Hariskos ◽  
...  

2018 ◽  
Vol 221 ◽  
pp. 216-219 ◽  
Author(s):  
Y. Yusoff ◽  
P. Chelvanathan ◽  
N. Kamaruddin ◽  
Md. Akhtaruzzaman ◽  
N. Amin

2021 ◽  
Vol 511 ◽  
pp. 111756
Author(s):  
Cheng Li ◽  
Fei Liu ◽  
Tianxiang Zhao ◽  
Jiarui Gu ◽  
Peng Chen ◽  
...  

1993 ◽  
Vol 297 ◽  
Author(s):  
Byung Chul Ahn ◽  
Jeong Hyun Kim ◽  
Dong Gil Kim ◽  
Byeong Yeon Moon ◽  
Kwang Nam Kim ◽  
...  

The hydrogenation effect was studied in the fabrication of amorphous silicon thin film transistor using APCVD technique. The inverse staggered type a-Si TFTs were fabricated with the deposited a-Si and SiO2 films by the atmospheric pressure (AP) CVD. The field effect mobility of the fabricated a-Si TFT is 0.79 cm2/Vs and threshold voltage is 5.4V after post hydrogenation. These results can be applied to make low cost a-Si TFT array using an in-line APCVD system.


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