The effect of recombination under short-circuit conditions on the determination of charge transport properties in nanostructured photoelectrodes
2016 ◽
Vol 18
(4)
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pp. 2303-2308
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Keyword(s):
We report on the commonly unaccounted for process of recombination under short-circuit conditions in nanostructured photoelectrodes with special attention to the charge collection efficiency.
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2018 ◽
Vol 11
(4)
◽
pp. 904-913
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Keyword(s):
2018 ◽
Vol 65
(3)
◽
pp. 950-954
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2009 ◽
Vol 56
(6)
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pp. 3828-3833
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Keyword(s):
3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency
2013 ◽
Vol 8
(03)
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pp. C03023-C03023
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