Charge-Coupled-Device Charge-Collection Efficiency And The Photon-Transfer Technique

1987 ◽  
Vol 26 (10) ◽  
Author(s):  
James R. Janesick ◽  
Kenneth P. Klaasen ◽  
Tom Elliott
Keyword(s):  
Collection Efficiency ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
Charge Coupled Device

3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency

2013 ◽  
Vol 8 (03) ◽  
pp. C03023-C03023 ◽  
Author(s):  
M Jakubek ◽  
J Jakubek ◽  
J Zemlicka ◽  
M Platkevic ◽  
V Havranek ◽  
...  
Keyword(s):  
Radiation Damage ◽  
3D Imaging ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Spatial Mapping ◽  
Charge Collection Efficiency ◽  
Silicon Sensor

Comparative Studies of Ionizing Radiation Detectors Made on the Basis of Various Types of Diamond Plates

2021 ◽  
Vol 23 (2) ◽  
pp. 68-75
Author(s):  
Altukhov A.A. ◽  
Keyword(s):  
Ionizing Radiation ◽  
Single Crystal ◽  
Comparative Studies ◽  
Collection Efficiency ◽  
Radiation Detectors ◽  
Charge Collection ◽  
Alpha Radiation ◽  
Charge Collection Efficiency ◽  
Polarization Phenomena

The results of experiments on the study of polarization phenomena and the charge collection efficiency in test structures of diamond ionizing radiation detectors using diamond plates of various types, including single-crystal NRNT-type, single-crystal CVD-type, as well as polycrystalline type, when exposed to alpha-radiation with an energy of 5.5 MeV are presented. Studies have demonstrated the existence of a number of problems with the device quality of diamond plates that affect the performance of spec-trometric-type detectors.

Degradation of Charge Collection Efficiency Obtained for 6H-SiC n+p Diodes Irradiated with Gold Ions

2007 ◽  
pp. 913-916
Author(s):  
Takeshi Ohshima ◽  
Takahiro Satoh ◽  
Masakazu Oikawa ◽  
Shinobu Onoda ◽  
Shigeomi Hishiki ◽  
...  
Keyword(s):  
Collection Efficiency ◽  
Charge Collection ◽  
Charge Collection Efficiency

Characterization of heterogeneities in detector-grade CdZnTe crystals

2009 ◽  
Vol 24 (4) ◽  
pp. 1361-1367 ◽  
Author(s):  
M.C. Duff ◽  
D.B. Hunter ◽  
A. Burger ◽  
M. Groza ◽  
V. Buliga ◽  
...  
Keyword(s):  
Room Temperature ◽  
Collection Efficiency ◽  
Analytical Techniques ◽  
Charge Collection ◽  
Secondary Phases ◽  
Charge Collection Efficiency

Synthetic Cd1–xZnxTe or “CZT” crystals are highly suitable for γ-spectrometers operating at room temperature. Secondary phases (SP) within CZT, presumed to be Te metal, have detrimental impacts on the charge collection efficiency of fabricated device. Using analytical techniques rather than arbitrary theoretical definitions, we identify two SP morphologies: (i) many void, 20-μm “negative” crystals with 65-nm nanoparticle residues of Si, Cd, Zn, and Te and (ii) 20-μm hexagonal-shaped bodies, which are composites of metallic Te layers with cores of amorphous and polycrystalline CZT material that surround the voids.

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