The role of ambient ice-like water adlayers formed at the interfaces of graphene on hydrophobic and hydrophilic substrates probed using scanning probe microscopy

2015 ◽  
Vol 17 (21) ◽  
pp. 13964-13972 ◽  
Author(s):  
Thavasiappan Gowthami ◽  
Gopal Tamilselvi ◽  
George Jacob ◽  
Gargi Raina

Ice-like water adlayer growth under ambient conditions for graphene on hydrophobic and hydrophilic substrates.

Author(s):  
Kevin M. Shakesheff ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
Philip M. Williams

2006 ◽  
Vol 45 (3B) ◽  
pp. 2328-2332 ◽  
Author(s):  
Kosaku Kato ◽  
Yukiko Ohmori ◽  
Takeomi Mizutani ◽  
Hisashi Haga ◽  
Kazuyo Ohashi ◽  
...  

2021 ◽  
Vol 12 ◽  
pp. 878-901
Author(s):  
Ido Azuri ◽  
Irit Rosenhek-Goldian ◽  
Neta Regev-Rudzki ◽  
Georg Fantner ◽  
Sidney R Cohen

Progress in computing capabilities has enhanced science in many ways. In recent years, various branches of machine learning have been the key facilitators in forging new paths, ranging from categorizing big data to instrumental control, from materials design through image analysis. Deep learning has the ability to identify abstract characteristics embedded within a data set, subsequently using that association to categorize, identify, and isolate subsets of the data. Scanning probe microscopy measures multimodal surface properties, combining morphology with electronic, mechanical, and other characteristics. In this review, we focus on a subset of deep learning algorithms, that is, convolutional neural networks, and how it is transforming the acquisition and analysis of scanning probe data.


2006 ◽  
Vol 6 (11) ◽  
pp. 3455-3459
Author(s):  
Yexian Qin ◽  
R. Reifenberger

Tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface interaction forces, the electrical and piezomechanical properties of a tuning fork has been characterized using techniques derived from scanning probe microscopy. After proper calibration, representative interaction force data for a conventional Si tip and an HOPG substrate are obtained under ambient conditions.


Author(s):  
D.A. Grigg

Scanning probe microscopy (SPM) has continued to advance into new applications and disciplines every year. The development of new techniques and instrumentation for SPM's have enabled researchers to study sample surfaces in a variety of ambient conditions and using a number of contrast mechanisms. A review of new SPM techniques and instrumentation will be presented.Phase imaging is a new technique that provides nanometer-scale information about variations in surface properties, such as adhesion, friction, viscoelasticity, composition and perhaps others, not revealed by any other single SPM technique. An example using phase imaging to differentiate component phases of composite materials is shown in Fig. 1 of wood pulp fiber. The left image is a normal topographic image acquired using the TappingMode™ technique. The right image is the simultaneous phase image. The phase image highlights cellulose microfibrils and a lignin component atop the cellulose component not seen in the topographic image. The details of phase imaging will be discussed.


2009 ◽  
Vol 94 (23) ◽  
pp. 233105 ◽  
Author(s):  
A. Verdaguer ◽  
M. Cardellach ◽  
J. J. Segura ◽  
G. M. Sacha ◽  
J. Moser ◽  
...  

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