scholarly journals On-chip read-out of picomechanical motion under ambient conditions

Nanoscale ◽  
2015 ◽  
Vol 7 (5) ◽  
pp. 1927-1933 ◽  
Author(s):  
Gino Putrino ◽  
Mariusz Martyniuk ◽  
Adrian Keating ◽  
Lorenzo Faraone ◽  
John Dell
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Sensing ◽  
Ambient Conditions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Novel Method ◽  
On Chip

A novel method for monitoring the nanomechanical movement of suspended cantilever structures which has great potential for use in applications ranging from biological/chemical sensing to atomic force microscopy.

Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

1995 ◽  
Vol 413 ◽  
Author(s):  
V. Shivshankar ◽  
C. Sung ◽  
J. Kumar ◽  
S. K. Tripathy ◽  
D. J. Sandman
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystals ◽  
Ambient Conditions ◽  
Free Standing ◽  
Force Microscopy ◽  
Sensor Performance ◽  
Atomic Force ◽  
Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

Direct Writing on Phosphate Glass Using Atomic Force Microscopy for Rapid Fabrication of Nanostructures

2016 ◽  
Author(s):  
Shama F. Barna ◽  
Kyle E. Jacobs ◽  
Glennys A. Mensing ◽  
Placid M. Ferreira
Keyword(s):  
Atomic Force Microscopy ◽  
Ion Beam ◽  
Soft Materials ◽  
Constant Current ◽  
Silver Nanostructures ◽  
Direct Writing ◽  
Ambient Conditions ◽  
Commercial Development ◽  
Force Microscopy ◽  
Atomic Force

Rapid and cost effective fabrication of nanostructures is critical for experimental exploration and translation of results for commercial development. While conventional techniques such as E-beam or Focused Ion beam lithography serve some prototyping needs for nano-scale experimentations, cost and rate considerations prohibit use for manufacturing. Specialized lithographic processes [e.g. nanosphere lithography or interference lithography] are also powerful tools in creating nanostructures but provide limited shapes, positioning and size control of nanostructures. In this work, we demonstrated a liquid-free and mask-less electrochemical writing approach using atomic force microscopy (AFM) that is capable of making arbitrary shapes of silver nanostructures in seconds on a solid state super-ionic (AgI)x (AgPO3)(1−x) glass. Under ambient conditions. silver is extracted selectively on super-ionic (AgI)x (AgPO3)(1−x) glass surface by negatively biasing an AFM probe relative to an Ag film counter electrode. Both voltage controlled and current controlled writings demonstrated localized extraction of silver. The current controlled approach is shown to be the preferred writing approach to make repeatable and uniform patterns of silver on (AgI)x AgPO3(1−x), where x represents the mole fraction of AgI in the mixture and the control parameter that tunes the conductivity of the sample. We demonstrated current controlled printing of silver on two different compositions of the material (i.e. (AgI)0.125 (AgPO3 )0.875 and (AgI)0.25(AgPO3)0.75 ). Depending on the magnitude of the constant current and tip speed, line-width of the silver pattern can be ∼150 nm. The length of these patterns are limited to the maximum distance the tip can be moved using the AFM position controls. The substrate being optically transparent allows the use of this writing technique for rapid prototyping plasmonic devices. By using the patterned substrate as a template for replica molding of soft materials such as polydimethylsiloxane (PDMS), this writing technique can also be utilized for high throughput nano-channel fabrication in biofluidics and microfluidics devices.

Atomic force microscopy imaging using a tip-on-chip: Opening the door to integrated near field nanotools

2010 ◽  
Vol 81 (9) ◽  
pp. 093707 ◽  
Author(s):  
J. Hayton ◽  
J. Polesel-Maris ◽  
R. Demadrille ◽  
M. Brun ◽  
F. Thoyer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
On Chip

AFM Study of Untreated and Treated Fibers of Mongolian Goat Cashmere

2009 ◽  
Vol 610-613 ◽  
pp. 175-178 ◽  
Author(s):  
Namsrai Javkhlantugs ◽  
Enkhbaatar Ankhbayar ◽  
Khishigjargal Tegshjargal ◽  
Damdin Enkhjargal ◽  
Chimed Ganzorig
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Fine Structure ◽  
Ambient Conditions ◽  
Bleaching Process ◽  
Surface Change ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
The Difference

The morphological surface change of untreated and treated fibers of the Mongolian goat cashmere was investigated by atomic force microscopy (AFM) at ambient conditions. The cuticle scale heights of the Mongolian goat cashmere fibers were measured by the AFM for the fibers before and after treatment. The experimental results showed that the difference between the fine structure of the cuticle and surface roughness of untreated and treated fibers. We found that the surface morphological change of the cashmere fibers was strongly degraded after the bleaching process.

Long-term stability and tree-ring oxidation of WSe2 using phase-contrast AFM

Nanoscale ◽  
2021 ◽  
Author(s):  
Lene Gammelgaard ◽  
Patrick Rebsdorf Whelan ◽  
Timothy J Booth ◽  
Peter Bøggild
Keyword(s):  
Atomic Force Microscopy ◽  
Tree Ring ◽  
Phase Contrast ◽  
Ambient Conditions ◽  
Force Microscopy ◽  
Long Term Stability ◽  
Atomic Force ◽  
Term Evolution ◽  
Ring Oxidation

In this work, we use atomic force microscopy (AFM) to investigate the long-term evolution of oxidative defects of tungsten diselenide (WSe2) in ambient conditions over a period of 75 months,...

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