Microwave synthesis and field effect transistor performance of stable colloidal indium-zinc-oxide nanoparticles

RSC Advances ◽  
2013 ◽  
Vol 3 (43) ◽  
pp. 20071 ◽  
Author(s):  
Shawn Sanctis ◽  
Rudolf C. Hoffmann ◽  
Jörg J. Schneider
2016 ◽  
Vol 4 (30) ◽  
pp. 7345-7352 ◽  
Author(s):  
Rudolf C. Hoffmann ◽  
Shawn Sanctis ◽  
Emre Erdem ◽  
Stefan Weber ◽  
Jörg J. Schneider

Variation of the ligand framework in 1,3-substituted zinc-diketonates provides a straightforward way to control size, morphology and electronic properties of semiconducting zinc oxide nanoparticles.


2020 ◽  
Vol 310 ◽  
pp. 127850 ◽  
Author(s):  
Sayani Palit ◽  
Kanishk Singh ◽  
Bih-Show Lou ◽  
Jim-Long Her ◽  
See-Tong Pang ◽  
...  

Nano Letters ◽  
2016 ◽  
Vol 16 (2) ◽  
pp. 1293-1298 ◽  
Author(s):  
Pyo Jin Jeon ◽  
Young Tack Lee ◽  
June Yeong Lim ◽  
Jin Sung Kim ◽  
Do Kyung Hwang ◽  
...  

2020 ◽  
Vol 1 (2) ◽  
pp. 14-21
Author(s):  
Chaw Su Nandar Hlaing Chaw ◽  
Thiri Nwe

This paper presents the band gap design and J-V characteristic curve of Zinc Oxide (ZnO) based on Junction Field Effect Transistor (JFET). The physical properties for analysis of semiconductor field effect transistor play a vital role in semiconductor measurements to obtain the high-performance devices. The main objective of this research is to design and analyse the band diagram design of semiconductor materials which are used for high performance junction field effect transistor. In this paper, the fundamental theory of semiconductors, the electrical properties analysis and bandgap design of materials for junction field effect transistor are described. Firstly, the energy bandgaps are performed based on the existing mathematical equations and the required parameters depending on the specified semiconductor material. Secondly, the J-V characteristic curves of semiconductor material are discussed in this paper. In order to achieve the current-voltage characteristic for specific junction field effect transistor, numerical values of each parameter which are included in analysis are defined and then these resultant values are predicted for the performance of junction field effect transistors. The computerized analyses have also mentioned in this paper.


Nanoscale ◽  
2018 ◽  
Vol 10 (43) ◽  
pp. 20377-20383 ◽  
Author(s):  
Youngjun Kim ◽  
Byoungnam Park

We fabricated a zinc oxide (ZnO)/methylammonium lead iodide (MAPbI3) perovskite/ZnO field effect transistor (FET) test platform device through which ZnO/perovskite interfacial contact properties can be probed in the dark and under illumination.


2015 ◽  
Vol 26 (4) ◽  
pp. 1064-1071 ◽  
Author(s):  
Jakub Sedlák ◽  
Ivo Kuřitka ◽  
Michal Machovský ◽  
Pavol Šuly ◽  
Pavel Bažant ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document