Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams

The Analyst ◽  
2013 ◽  
Vol 138 (22) ◽  
pp. 6801 ◽  
Author(s):  
T. Mouhib ◽  
C. Poleunis ◽  
N. Wehbe ◽  
J. J. Michels ◽  
Y. Galagan ◽  
...  
Keyword(s):  
Comparative Evaluation ◽  
Depth Profiling ◽  
Organic Photovoltaic ◽  
Tof Sims ◽  
Molecular Depth Profiling

scholarly journals Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imaging

2008 ◽  
Vol 255 (4) ◽  
pp. 1158-1161 ◽  
Author(s):  
M.E. Kurczy ◽  
Joseph Kozole ◽  
S.A. Parry ◽  
P.D. Piehowski ◽  
Nicholas Winograd ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Relative Quantification ◽  
Tof Sims ◽  
Molecular Depth Profiling

C60 molecular depth profiling of bilayered polymer films using ToF-SIMS

2010 ◽  
Vol 43 (1-2) ◽  
pp. 175-178 ◽  
Author(s):  
T. Mouhib ◽  
A. Delcorte ◽  
C. Poleunis ◽  
P. Bertrand
Keyword(s):  
Polymer Films ◽  
Depth Profiling ◽  
Tof Sims ◽  
Molecular Depth Profiling

Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMS

2008 ◽  
Vol 14 (S2) ◽  
pp. 466-467
Author(s):  
JS Hammond ◽  
GL Fisher ◽  
S Raman ◽  
JF Moulder
Keyword(s):  
New Mexico ◽  
Molecular Imaging ◽  
Depth Profiling ◽  
Tof Sims ◽  
Molecular Depth Profiling

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

scholarly journals Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protocol, A Comparison with Depth Profiling

2021 ◽  
Vol 27 (S1) ◽  
pp. 1564-1565
Author(s):  
Vincent Smentkowski ◽  
Shubhodeep Goswami ◽  
Felix Kollmer ◽  
Julia Zakel ◽  
Henrik Arlinghaus ◽  
...  
Keyword(s):  
Thin Film ◽  
Depth Profiling ◽  
Tof Sims

scholarly journals Direct comparison of Au3+ and C60+ cluster projectiles in SIMS molecular depth profiling

2007 ◽  
Vol 18 (3) ◽  
pp. 406-412 ◽  
Author(s):  
Juan Cheng ◽  
Joseph Kozole ◽  
Robert Hengstebeck ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Molecular Depth Profiling

Depth Profiling of Organic Light-Emitting Diodes by ToF-SIMS Coupled with Wavelet–Principal Component Analysis

2019 ◽  
Vol 1 (7) ◽  
pp. 1821-1828 ◽  
Author(s):  
Céline Noël ◽  
Nunzio Tuccitto ◽  
Yan Busby ◽  
Manuel Auer-Berger ◽  
Antonino Licciardello ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Light Emitting Diodes ◽  
Depth Profiling ◽  
Principal Component ◽  
Component Analysis ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Tof Sims ◽  
Organic Light

TOF-SIMS depth profiling of SIMON

2003 ◽  
Vol 203-204 ◽  
pp. 441-444
Author(s):  
Ge Xin ◽  
Gui Dong ◽  
Chen Xu ◽  
Cha Liangzhen ◽  
O. Brox ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Tof Sims ◽  
Sims Depth Profiling

ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 190-193 ◽  
Author(s):  
Nimer Wehbe ◽  
Laurent Houssiau
Keyword(s):  
Vitamin C ◽  
Depth Profiling ◽  
Ion Beams ◽  
Tof Sims ◽  
Sims Depth Profiling
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