scholarly journals High precision Mg isotope measurements of meteoritic samples by secondary ion mass spectrometry

2013 ◽  
Vol 28 (1) ◽  
pp. 67-76 ◽  
Author(s):  
Tu-Han Luu ◽  
Marc Chaussidon ◽  
Ritesh Kumar Mishra ◽  
Claire Rollion-Bard ◽  
Johan Villeneuve ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Precision ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Isotope Measurements

scholarly journals Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry

2021 ◽  
Vol 8 ◽  
Author(s):  
Nordine Bouden ◽  
Johan Villeneuve ◽  
Yves Marrocchi ◽  
Etienne Deloule ◽  
Evelyn Füri ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Oxygen Isotope ◽  
Spatial Resolution ◽  
Secondary Ion Mass Spectrometry ◽  
Small Radius ◽  
Large Radius ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Isotope Measurements

Secondary ion mass spectrometry (SIMS) is a powerful technique for in situ triple oxygen isotope measurements that has been used for more than 30 years. Since pioneering works performed on small-radius ion microprobes in the mid-80s, tremendous progress has been made in terms of analytical precision, spatial resolution and analysis duration. In this respect, the emergence in the mid-90s of the large-radius ion microprobe equipped with a multi-collector system (MC-SIMS) was a game changer. Further developments achieved on CAMECA MC-SIMS since then (e.g., stability of the electronics, enhanced transmission of secondary ions, automatic centering of the secondary ion beam, enhanced control of the magnetic field, 1012Ω resistor for the Faraday cup amplifiers) allow nowadays to routinely measure oxygen isotopic ratios (18O/16O and 17O/16O) in various matrices with a precision (internal error and reproducibility) better than 0.5‰ (2σ), a spatial resolution smaller than 10 µm and in a few minutes per analysis. This paper focuses on the application of the MC-SIMS technique to the in situ monitoring of mass-independent triple oxygen isotope variations.

scholarly journals Triple Oxygen Isotope Measurements by Multi-Collector Large-Geometry Secondary Ion Mass Spectrometry

2021 ◽  
Author(s):  
Paula Peres ◽  
Nordine Bouden ◽  
Johan Villeneuve ◽  
Yves Marrocchi ◽  
Etienne Deloule ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Oxygen Isotope ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Isotope Measurements

High Precision Measurement of Obsidian Hydration Layers on Artifacts from the Hopewell Site Using Secondary Ion Mass Spectrometry

2004 ◽  
Vol 69 (3) ◽  
pp. 555-567 ◽  
Author(s):  
Christopher M. Stevenson ◽  
Ihab Abdelrehim ◽  
Steven W. Novak
Keyword(s):  
Mass Spectrometry ◽  
High Precision ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Layer Depth ◽  
High Precision Measurement ◽  
Long Distance ◽  
Ion Mass Spectrometry ◽  
Hydration Layers ◽  
Secondary Ion

Obsidian hydration dating has served as one of the chronological indicators for the Hopewell Culture earthworks (ca. 200 B.C.—A.D. 500) in central Ohio. This work presents new obsidian hydration dates developed from high precision hydration layer depth profiling using secondary ion mass spectrometry (SIMS). These data suggest that long-distance exchange in obsidian occurred throughout the Hopewell period.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Sign in / Sign up

Export Citation Format

Share Document