Mechanisms for charge trapping in single semiconductor nanocrystals probed by fluorescence blinking

2013 ◽  
Vol 42 (8) ◽  
pp. 3209 ◽  
Author(s):  
Amy A. Cordones ◽  
Stephen R. Leone
Keyword(s):  
Semiconductor Nanocrystals ◽  
Charge Trapping ◽  
Fluorescence Blinking

scholarly journals A microscopic picture of surface charge trapping in semiconductor nanocrystals

2013 ◽  
Vol 138 (20) ◽  
pp. 204705 ◽  
Author(s):  
Jonathan Mooney ◽  
Michael M. Krause ◽  
Jonathan I. Saari ◽  
Patanjali Kambhampati
Keyword(s):  
Surface Charge ◽  
Semiconductor Nanocrystals ◽  
Charge Trapping ◽  
Microscopic Picture

Charge Trapping and Degradation Properties of PZT Thin Films for MEMS

1996 ◽  
Vol 444 ◽  
Author(s):  
Hyeon-Seag Kim ◽  
D. L. Polla ◽  
S. A. Campbell
Keyword(s):  
Thin Films ◽  
Loss Factor ◽  
High Field ◽  
Microelectromechanical Systems ◽  
Charge Trapping ◽  
Metal Organic ◽  
Electrical Reliability ◽  
Silicon Based ◽  
Degradation Properties ◽  
Organic Decomposition

AbstractThe electrical reliability properties of PZT (54/46) thin films have been measured for the purpose of integrating this material with silicon-based microelectromechanical systems. Ferroelectric thin films of PZT were prepared by metal organic decomposition. The charge trapping and degradation properties of these thin films were studied through device characteristics such as hysteresis loop, leakage current, fatigue, dielectric constant, capacitancevoltage, and loss factor measurements. Several unique experimental results have been found. Different degradation processes were verified through fatigue (bipolar stress), low and high charge injection (unipolar stress), and high field stressing (unipolar stress).

Spins in Semiconductor Nanocrystals

Priroda ◽  
2018 ◽  
pp. 22-31
Author(s):  
A. Rodina ◽  
◽  
D. Yakovlev ◽  
Keyword(s):  
Semiconductor Nanocrystals

A comparative study of charge trapping effect in p-type MoTe2 and WSe2 FETs using pulsed current–voltage measurements

2021 ◽  
Vol 60 (1) ◽  
pp. 011003
Author(s):  
Jeong Yong Yang ◽  
Chan Ho Lee ◽  
Young Taek Oh ◽  
Jiyeon Ma ◽  
Junseok Heo ◽  
...  
Keyword(s):  
Comparative Study ◽  
Charge Trapping ◽  
Pulsed Current ◽  
Trapping Effect ◽  
Current Voltage ◽  
P Type

scholarly journals Charge Trapping in Mixed Organic Donor-Acceptor Semiconductor Thin Films

2014 ◽  
Vol 26 (45) ◽  
pp. 7555-7560 ◽  
Author(s):  
Shota Nunomura ◽  
Xiaozhou Che ◽  
Stephen R. Forrest
Keyword(s):  
Thin Films ◽  
Charge Trapping ◽  
Semiconductor Thin Films ◽  
Donor Acceptor
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