Coupling a wavelength dispersive spectrometer with a synchrotron-based X-ray microscope: A winning combination for micro-X-ray fluorescence and micro-XANES analyses of complex artistic materials

2011 ◽  
Vol 26 (5) ◽  
pp. 1051 ◽  
Author(s):  
M. Cotte ◽  
J. Szlachetko ◽  
S. Lahlil ◽  
M. Salomé ◽  
V. A. Solé ◽  
...  
Keyword(s):  
X Ray ◽  
Wavelength Dispersive Spectrometer

The Use of Rapid Quantitative X-ray Fluorescence Analysis in Paper Manufacturing and Construction Materials Industry

1984 ◽  
Vol 28 ◽  
pp. 195-202 ◽  
Author(s):  
Vladimir Kocman ◽  
Linda Foley ◽  
Stanley C. Woodger
Keyword(s):  
Construction Materials ◽  
Fluorescence Analysis ◽  
Analytical Laboratory ◽  
Large Corporation ◽  
X Ray ◽  
Paper Manufacturing ◽  
Fluorescence Methods ◽  
Wavelength Dispersive Spectrometer ◽  
Modern Analytical

A modern analytical laboratory of a large corporation manufacturing paper, construction materials and chemicals must be sufficiently diversified in methodology to provide accurate results in the shortest possible time. Among other techniques the implementation of an automated “menu” driven wavelength dispersive spectrometer allowed for the setting-up of a variety of quantitative X-ray fluorescence methods.

Evaluation of chemical speciation on Lp (p = l, α, η, β) X-ray emission peaks of thallium compounds with a wavelength-dispersive spectrometer

2020 ◽  
Vol 35 (12) ◽  
pp. 2935-2947
Author(s):  
Harpreet Singh Kainth ◽  
Deeksha Khandelwal
Keyword(s):  
Chemical Speciation ◽  
Emission Lines ◽  
X Ray ◽  
Laboratory Source ◽  
Wavelength Dispersive Spectrometer ◽  
Thallium Compounds

The measurements of X-ray emission lines in atomic decay to the L-shell of thallium compounds were performed using a laboratory source-based conventional wavelength dispersive spectrometer.

Intensity and Distribution of Background X-Rays in a Wavelength-Dispersive Spectrometer. II. Applications

1988 ◽  
Vol 32 ◽  
pp. 83-87
Author(s):  
K. Omote ◽  
T. Arai
Keyword(s):  
Trace Elements ◽  
Spectroscopic Analysis ◽  
Background Intensity ◽  
X Rays ◽  
Correction Procedure ◽  
Minor And Trace Elements ◽  
X Ray ◽  
Powder Samples ◽  
Analytical Accuracy ◽  
Wavelength Dispersive Spectrometer

In the spectroscopic analysis of minor and trace elements by fluorescent X-rays, many improvements in the analytical performance of trace element measurements have been made. For the analysis of trace elements, the background intensity governs the analytical accuracy and the lowest detection limit in a sample. A comparison is made between experimental and theoretically calculated background X-ray intensities in a previous paper. It is based on the formula for scattered X-ray intensity, from the estimation of Thomson and Compton scattered X-rays. Also, the asymmetrical peak profiles at the base of the giant intensity peak are discussed and are clearly shown in the skirt part of K beta X-rays, e.g. , Ni-K beta or Fe-K beta X-rays. The purpose of this report is to investigate the intensity of background X-rays, using glass beads and powder samples of iron oxide and quartz, based on the previous fundamental studies and the overlapping correction procedure for cobalt determination in low-alloy and stainless steel.

scholarly journals Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)

2010 ◽  
Vol 17 (3) ◽  
pp. 400-408 ◽  
Author(s):  
J. Szlachetko ◽  
M. Cotte ◽  
J. Morse ◽  
M. Salomé ◽  
P. Jagodzinski ◽  
...  
Keyword(s):  
X Ray ◽  
Wavelength Dispersive Spectrometer

Experimental Method to Determine the Absolute Efficiency Curve of a Wavelength Dispersive Spectrometer

2008 ◽  
Vol 14 (4) ◽  
pp. 306-314 ◽  
Author(s):  
Jorge Trincavelli ◽  
Silvina Limandri ◽  
Alejo Carreras ◽  
Rita Bonetto
Keyword(s):  
Electron Probe ◽  
Energy Dispersive Spectrometer ◽  
Efficiency Curve ◽  
Simple Analytical Expression ◽  
X Ray ◽  
Absolute Efficiency ◽  
Dispersive System ◽  
Wavelength Dispersive Spectrometer ◽  
The Absolute

A method for the experimental determination of the absolute efficiency of wavelength dispersive spectrometers was developed, based on the comparison of spectra measured with a wavelength dispersive system and with an energy dispersive spectrometer. The aim of studying this parameter arises because its knowledge is necessary to perform standardless analysis. A simple analytical expression was obtained for the efficiency curve for three crystals (TAP, PET, and LiF) of the spectrometer used, within an energy range from 0.77 to 10.83 keV. Although this expression is particular for the system used in this work, the method may be extended to other spectrometers and crystals for electron probe microanalysis and X-ray fluorescence.

X-ray image analysis: An application to petrographic modal analysis

1989 ◽  
Vol 47 ◽  
pp. 682-683
Author(s):  
Long-Cheng Liang
Keyword(s):  
Image Analysis ◽  
Modal Analysis ◽  
Logical Operation ◽  
X Ray ◽  
Backscattered Electrons ◽  
Average Atomic Number ◽  
Mineral Components ◽  
Atomic Number Contrast ◽  
Wavelength Dispersive Spectrometer ◽  
Mineral Identification

Image analysis is a fast and accurate technique for measuring the relative amounts of various mineral components of a rock. In a routine scanning electron microscope (SEM) based modal analysis, backscattered electrons (BSE) are used to generate average atomic number contrast to determine the presence of the various minerals. The minerals are then identified with the use of an energy dispersive (EDS) or a wavelength dispersive spectrometer (WDS). Once a mineral is identified, its modal percent can be calculated by comparing the area of pixels which the mineral occupies with the total area scanned. This BSE/EDS method works well in most cases except where samples contain minerals with similar average atomic numbers or backscattering coefficients, thus producing ambiguity in mineral identification. In an attempt to eliminate this ambiguity and to enhance the analytical capabilities of image analysis, the present study will evaluate a superimposed x-ray map method which utilizes the logical operation of conjunction (AND) to combine multiple x-ray maps of characteristic elements to complete the modal analysis.

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