Detection and characterization of artefact compounds during selenium speciation analysis in yeast by ICP-MS-assisted MALDI MS, oMALDI MS/MS and LC-ES-MS/MS
2006 ◽
Vol 21
(7)
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pp. 703-707
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2004 ◽
Vol 19
(12)
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pp. 1529-1538
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2008 ◽
Vol 23
(4)
◽
pp. 514
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