High mass resolution secondary ion mass spectrometry via simultaneous detection with a charge-coupled device

1991 ◽  
Vol 63 (8) ◽  
pp. 788-792 ◽  
Author(s):  
David S. Mantus ◽  
Gary A. Valaskovic ◽  
George H. Morrison
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Simultaneous Detection ◽  
Mass Resolution ◽  
High Mass ◽  
Charge Coupled Device ◽  
High Mass Resolution ◽  
Ion Mass Spectrometry ◽  
A Charge ◽  
Secondary Ion

Simultaneous quantitative determination of the distribution of dopants in silicon by high mass resolution secondary ion mass spectrometry

1989 ◽  
Vol 61 (5) ◽  
pp. 412-416 ◽  
Author(s):  
Gerhard. Stingeder ◽  
Kurt. Piplits ◽  
Stefan. Gara ◽  
Manfred. Grasserbauer ◽  
Matthias. Budil ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Quantitative Determination ◽  
Secondary Ion Mass Spectrometry ◽  
Mass Resolution ◽  
High Mass ◽  
High Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

A discussion on mass resolution in secondary ion mass spectrometry

2019 ◽  
Vol 52 (5) ◽  
pp. 249-255
Author(s):  
Zhanping Li ◽  
Lixia Zhao ◽  
Bing Xiong ◽  
Runlong Fan ◽  
Dunyi Liu ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Mass Resolution ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12]

1992 ◽  
Vol 47 (7) ◽  
pp. 929-936 ◽  
Author(s):  
Herbert Feld ◽  
Angelika Leute ◽  
Derk Rading ◽  
Alfred Benninghoven ◽  
G. Henkel ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Metal Complexes ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Cluster Ions ◽  
High Mass ◽  
Plasma Desorption ◽  
Ion Mass Spectrometry ◽  
Thiolate Complexes ◽  
Secondary Ion

The use of mass spectrometry for the analysis of transition metal complexes is demonstrated by combined high resolution Plasma Desorption Mass Spectrometry (PDMS) and Secondary Ion Mass Spectrometry (SIMS) investigations of the neutral nickel thiolate complexes [Ni4(SC3H7)8] (1), [Ni4(SC6H11)8] (2), [Ni8(SCH2COOEt)16] (3) and [Ni6(SC3H7)12] (4). The positive spectra are dominated by three kinds of SI-species: (a) molecular ions, (b) fragment ions and (c) molecular ions with one or more substrate atoms attached. The negative spectra show mainly nickel sulfur cluster ions of the composition (NixSy)-. In contrast to many Fast Atom Bombardment (FAB) spectra of neutral metal complexes, SIMS and PDMS spectra provide molecular weight as well as fragment ion information. Both techniques are most powerful tools for the investigation of coordination compounds because the samples are easy to prepare and the spectra are independent of matrix conditions. Additionally crystallographic studies have been carried out for 4. The hexanuclear complex 4 with square planar Ni-S coordination sites crystallizes in the trigonal space group R 3̅ with Z = 3 and α = 18.537(5), c = 13.966(3) Å.

Time-of-flight secondary ion mass spectrometry of nylons: detection of high mass fragments

1985 ◽  
Vol 57 (12) ◽  
pp. 2384-2388 ◽  
Author(s):  
Ioannis V. Bletsos ◽  
David M. Hercules ◽  
Dieter. Greifendorf ◽  
Alfred. Benninghoven
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
High Mass ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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