scholarly journals Single Shot Coherence Properties of the Free-Electron Laser SACLA in the Hard X-ray Regime

2014 ◽  
Vol 4 (1) ◽  
Author(s):  
Felix Lehmkühler ◽  
Christian Gutt ◽  
Birgit Fischer ◽  
Martin A. Schroer ◽  
Marcin Sikorski ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray

scholarly journals Erratum: Single Shot Coherence Properties of the Free-Electron Laser SACLA in the Hard X-ray Regime

2014 ◽  
Vol 4 (1) ◽  
Author(s):  
Felix Lehmkühler ◽  
Christian Gutt ◽  
Birgit Fischer ◽  
Martin A. Schroer ◽  
Marcin Sikorski ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray

scholarly journals Spectral monitoring at SwissFEL using a high-resolution on-line hard X-ray single-shot spectrometer

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Christian David ◽  
Gediminas Seniutinas ◽  
Mikako Makita ◽  
Benedikt Rösner ◽  
Jens Rehanek ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Reference Data ◽  
Diffraction Order ◽  
Laser Pulses ◽  
Single Shot ◽  
Spectral Measurements ◽  
X Ray ◽  
On Line ◽  
Spectral Monitoring

The performance and parameters of the online photon single-shot spectrometer (PSSS) at the Aramis beamline of the SwissFEL free-electron laser are presented. The device operates between the photon energies 4 and 13 keV and uses diamond transmission gratings and bent Si crystals for spectral measurements on the first diffraction order of the beam. The device has an energy window of 0.7% of the median photon energy of the free-electron laser pulses and a spectral resolution (full width at half-maximum) ΔE/E on the order of 10−5. The device was characterized by comparing its performance with reference data from synchrotron sources, and a parametric study investigated other effects that could affect the reliability of the spectral information.

Single-shot arrival timing diagnostics for a soft X-ray free-electron laser beamline at SACLA

2018 ◽  
Vol 25 (1) ◽  
pp. 68-71 ◽  
Author(s):  
Shigeki Owada ◽  
Kyo Nakajima ◽  
Tadashi Togashi ◽  
Tetsuo Kayatama ◽  
Makina Yabashi
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Imaging System ◽  
Laser Pulses ◽  
Single Shot ◽  
Simultaneous Operation ◽  
One Dimensional ◽  
X Ray ◽  
Arrival Timing ◽  
Optical Laser

Arrival timing diagnostics performed at a soft X-ray free-electron laser (FEL) beamline of SACLA are described. Intense soft X-ray FEL pulses with one-dimensional focusing efficiently induce transient changes of optical reflectivity on the surface of GaAs. The arrival timing between soft X-ray FEL and optical laser pulses was successfully measured as a spatial position of the reflectivity change. The temporal resolution evaluated from the imaging system reaches ∼10 fs. This method requires only a small portion of the incident pulse energy, which enables the simultaneous operation of the arrival timing diagnostics and experiments by introducing a wavefront-splitting scheme.

Single-shot beam-position monitor for x-ray free electron laser

2011 ◽  
Vol 82 (2) ◽  
pp. 023108 ◽  
Author(s):  
Kensuke Tono ◽  
Togo Kudo ◽  
Makina Yabashi ◽  
Takeshi Tachibana ◽  
Yiping Feng ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
Beam Position Monitor ◽  
Beam Position ◽  
X Ray

scholarly journals Flow-aligned, single-shot fiber diffraction using a femtosecond X-ray free-electron laser

Cytoskeleton ◽  
2017 ◽  
Vol 74 (12) ◽  
pp. 472-481 ◽  
Author(s):  
David Popp ◽  
N. Duane Loh ◽  
Habiba Zorgati ◽  
Umesh Ghoshdastider ◽  
Lu Ting Liow ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray ◽  
Fiber Diffraction

scholarly journals The free-electron laser FLASH

2015 ◽  
Vol 3 ◽  
Author(s):  
Siegfried Schreiber ◽  
Bart Faatz
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Extreme Ultraviolet ◽  
Laser Flash ◽  
Single Shot ◽  
Short Pulses ◽  
X Ray ◽  
Pump And Probe ◽  
User Facility ◽  
Diffraction Imaging

FLASH at DESY, Hamburg, Germany is the first free-electron laser (FEL) operating in the extreme ultraviolet (EUV) and soft x-ray wavelength range. FLASH is a user facility providing femtosecond short pulses with an unprecedented peak and average brilliance, opening new scientific opportunities in many disciplines. The first call for user experiments has been launched in 2005. The FLASH linear accelerator is based on TESLA superconducting technology, providing several thousands of photon pulses per second to user experiments. Probing femtosecond-scale dynamics in atomic and molecular reactions using, for instance, a combination of x-ray and optical pulses in a pump and probe arrangement, as well as single-shot diffraction imaging of biological objects and molecules, are typical experiments performed at the facility. We give an overview of the FLASH facility, and describe the basic principles of the accelerator. Recently, FLASH has been extended by a second undulator beamline (FLASH2) operated in parallel to the first beamline, extending the capacity of the facility by a factor of two.

scholarly journals Data processing software suiteSITENNOfor coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

2014 ◽  
Vol 21 (3) ◽  
pp. 600-612 ◽  
Author(s):  
Yuki Sekiguchi ◽  
Tomotaka Oroguchi ◽  
Yuki Takayama ◽  
Masayoshi Nakasako
Keyword(s):  
Data Processing ◽  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Custom Made ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Ccd Detectors

Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the `diffraction before destruction' scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite namedSITENNOhas been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using theSITENNOsuite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles.

scholarly journals In situ single-shot diffractive fluence mapping for X-ray free-electron laser pulses

2018 ◽  
Vol 9 (1) ◽  
Author(s):  
Michael Schneider ◽  
Christian M. Günther ◽  
Bastian Pfau ◽  
Flavio Capotondi ◽  
Michele Manfredda ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Laser Pulses ◽  
Single Shot ◽  
X Ray
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