scholarly journals Erratum: Optically monitoring and controlling nanoscale topography during semiconductor etching

2012 ◽  
Vol 1 (10) ◽  
pp. e44-e44 ◽  
Author(s):  
Chris Edwards ◽  
Amir Arbabi ◽  
Gabriel Popescu ◽  
Lynford L Goddard
Keyword(s):  
Semiconductor Etching ◽  
Nanoscale Topography

scholarly journals Optically monitoring and controlling nanoscale topography during semiconductor etching

2012 ◽  
Vol 1 (9) ◽  
pp. e30-e30 ◽  
Author(s):  
Chris Edwards ◽  
Amir Arbabi ◽  
Gabriel Popescu ◽  
Lynford L Goddard
Keyword(s):  
Semiconductor Etching ◽  
Nanoscale Topography

Influence of systematically varied nanoscale topography on the morphology of epithelial cells

2003 ◽  
Vol 2 (2) ◽  
pp. 49-57 ◽  
Author(s):  
A. Andersson ◽  
J. Brink ◽  
U. Lidberg ◽  
D.S. Sutherland
Keyword(s):  
Epithelial Cells ◽  
Nanoscale Topography

scholarly journals Nanoscale Topography–Induced Modulation of Fundamental Cell Behaviors of Rabbit Corneal Keratocytes, Fibroblasts, and Myofibroblasts

2010 ◽  
Vol 51 (3) ◽  
pp. 1373 ◽  
Author(s):  
Simon A. Pot ◽  
Sara J. Liliensiek ◽  
Kathern E. Myrna ◽  
Ellison Bentley ◽  
James V. Jester ◽  
...  
Keyword(s):  
Cell Behaviors ◽  
Nanoscale Topography ◽  
Corneal Keratocytes

scholarly journals Heated-Tip AFM: Applications in Nanocomposite Polymer Membranes and Energetic Materials

2007 ◽  
Vol 15 (1) ◽  
pp. 20-25
Author(s):  
Jason P. Killgore ◽  
William King ◽  
Kevin Kjoller ◽  
René M. Overney
Keyword(s):  
Data Storage ◽  
Energetic Materials ◽  
Measurement Capability ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanocomposite Polymer ◽  
Wide Range ◽  
Measurement And Analysis ◽  
Nanoscale Topography ◽  
Temperature Controlled

Atomic Force Microscopy (AFM) is a key technique for the measurement and analysis of samples when nanoscale topography is of interest. It offers a number of complementary probing modes that extend an AFM's measurement capability to a wide range of material and transport properties of surfaces, including hardness, friction, conductivity and adhesion among others. Sample temperature controlled AFM extends the study of surface morphology and properties to include changes in the material phases.Recently, silicon microfabricated AFM cantilevers that have integrated heaters, as shown in figure 1, have become commercially available. These cantilevers were initially developed for probe based data storage by researchers at IBM Zurich, Figure 1. With the availability of these cantilevers, AFM measurements can be performed where the tip is heated as opposed to the sample.

scholarly journals An Elementary Model for Control of a Semiconductor Etching Process

SIAM Review ◽  
2002 ◽  
Vol 44 (4) ◽  
pp. 678-695
Author(s):  
A. Madhukar ◽  
T. Parent ◽  
I. G. Rosen ◽  
C. Wang
Keyword(s):  
Etching Process ◽  
Elementary Model ◽  
Semiconductor Etching

scholarly journals Electrospun Nanometer to Micrometer Scale Biomimetic Synthetic Membrane Scaffolds in Drug Delivery and Tissue Engineering: A Review

2019 ◽  
Vol 9 (5) ◽  
pp. 910
Author(s):  
Shaleena Pazhanimala ◽  
Driton Vllasaliu ◽  
Bahijja Raimi-Abraham
Keyword(s):  
Drug Delivery ◽  
Tissue Engineering ◽  
Cell Growth ◽  
Basement Membrane ◽  
Growth Environment ◽  
Synthetic Membrane ◽  
Nanoscale Topography ◽  
Micrometer Scale ◽  
Physical And Chemical ◽  
Natural Cell

The scaffold technology research utilizes biomimicry to produce efficient scaffolds that mimic the natural cell growth environment including the basement membrane for tissue engineering. Because the natural basement membrane is composed of fibrillar protein networks of nanoscale diameter, the scaffold produced should efficiently mimic the nanoscale topography at a low production cost. Electrospinning is a technique that can achieve that. This review discusses the physical and chemical characteristics of the basement membrane and its significance on cell growth and overall focuses on nanoscale biomimetic synthetic membrane scaffolds primarily generated using electrospinning and their application in drug delivery and tissue engineering.

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