Atomic Physics and Related Subjects.: Communications to Nature.: Glancing Angle of Reflection from Galcite for Silver (Kα1) X-Rays

Nature ◽  
1930 ◽  
Vol 125 (3151) ◽  
pp. 461-461
Author(s):  
CHARLTON DOWS COOKSEY ◽  
DONALD COOKSEY
1930 ◽  
Vol 35 (5) ◽  
pp. 564-565
Author(s):  
Charlton Dows Cooksey ◽  
Donald Cooksey

CORROSION ◽  
10.5006/3912 ◽  
2021 ◽  
Author(s):  
Arthur Situm ◽  
Xiaoxuan Guo ◽  
Burke Barlow ◽  
Bao Guo ◽  
Ian Burgess ◽  
...  

Polymer coatings can be used to mitigate the corrosion of steel in high chloride environments. Obtaining speciation information from thin corrosion layers can be important for understanding corrosion mechanisms, including polymer coating failure. This study outlines the effectiveness of collecting glancing angle X-ray absorption near edge spectroscopy (GA-XANES) spectra at the Fe K-edge to obtain chemical speciation information at the polymer-steel interface without removal of the polymer film. The depth of penetration of the incident X-rays can be altered by changing the incidence angle, allowing for more fluorescence signal from corrosion products to be detected relative to the Fe metal fluorescence signal in GA-XANES spectra. This study demonstrates the use of GA-XANES to study thin layers of steel corrosion and obtain depth profile information of steel corrosion products beneath a polymethyl methacrylate polymer coating.


1994 ◽  
Vol 376 ◽  
Author(s):  
J.F. Ankner ◽  
P.D. Gallagher ◽  
A. Schreyer ◽  
H. Zhang ◽  
C.F. Majkrzak ◽  
...  

ABSTRACTBy exciting diffraction in the Laue geometry by specularly reflected beams, penetrating x-rays and neutrons can be used to probe surface and interfacial atomic structure. We present the first such measurement utilizing polarized neutrons with both incident- and exit-angle resolution. We have observed the evolution of magnetic order by monitoring the in-plane (1010) Bragg peak from an epitaxially grown film consisting of 150 Å Y(0001) on 5000 Å Gd(0001). Magnetic scattering increases as the film is cooled from the Gd bulk Curie temperature (293K) to 100 K. The gross features of the data can be captured by a simple two-layer model, but sufficient disagreement remains that one may yet hope to extract non-trivial structure at the Y/Gd interface.


2000 ◽  
Vol 78 (8) ◽  
pp. 747-754 ◽  
Author(s):  
W T Chyla

The general law of reflection concerns situations when the light ray undergoes a shift of frequency at the reflection point. For example, it governs reflection of light rays from a moving mirror (either in a vacuum or in a transparent medium), reflection from a motionless mirror coated with a layer of Raman-active molecules in the coherent-scattering regime, or external reflection of X-rays from the surface of a condensed matter sample, with partial dissipation of energy within the skin depth. The general law of reflection is derived from the extremum principle for propagation of variable-frequency light rays. It states that the angle of reflection depends not only on the angle of incidence but also on the frequency shift in the reflection point and dispersion of the refractive index of the medium in contact with the mirror. The compatibility of the general law of reflection and the special relativistic treatment of reflection is examined in detail. Applications of the new law of reflection are discussed in the special relativistic and the nonrelativistic regime. PACS Nos.: 42.15-i, 03.30+p


2021 ◽  
Vol 28 (5) ◽  
Author(s):  
Takayuki Muro ◽  
Yasunori Senba ◽  
Haruhiko Ohashi ◽  
Takuo Ohkochi ◽  
Tomohiro Matsushita ◽  
...  

An endstation dedicated to angle-resolved photoemission spectroscopy (ARPES) using a soft X-ray microbeam has been developed at the beamline BL25SU of SPring-8. To obtain a high photoemission intensity, this endstation is optimized for measurements under the condition of grazing beam incidence to a sample surface, where the glancing angle is 5° or smaller. A Wolter mirror is used for focusing the soft X-rays. Even at the glancing angle of 5°, the smallest beam spot still having a sufficient photon flux for ARPES is almost round on the sample surface and the FWHM diameter is ∼5 µm. There is no need to change the sample orientation for performing k x − k y mapping by virtue of the electron lens with a deflector of the photoelectron analyzer, which makes it possible to keep the irradiation area unchanged. A partially cleaved surface area as small as ∼20 µm was made on an Si(111) wafer and ARPES measurements were performed. The results are presented.


1966 ◽  
Vol 10 ◽  
pp. 32-41 ◽  
Author(s):  
M. Renninger

AbstractGuided by the dispersion, surface of dynamical theory, we easily obtain evidence of the fact that in asymmetrical surface reflections (Bragg case) of X-rays at a perfect crystal, the angular widths of the incident and reflected beams are different from the same widths in the symmetrical Bragg case. The beam with the smaller glancing angle to the surface is angularly expanded, the other one, contracted (though in cross section, the former is contracted and the latter, expanded). Consequently, if the incident glancing angle is the smaller one (striping incidence, Vreftection), the angular width of the reflected beam is smaller than in the symmetric case (S-reflection), and that of the reflected section out of the primary beam is greater, and vice versa (striping emergence, if-reflection). At striping incidence, a contraction occurs, whereas at striping emergence, expansion of the angular reflection range occurs. These facts offer a number of possibilities for applying asymmetrical reflections to the well-known technique of the two crystal diffractometer—the author proposes the term “diffractometer” instead of the widely used “spectrometer”—in the (nv, −n)-position. These possibilities extend the efficiency of the double diffractometer with multiple effects, and some of them are given below: (1) Realization of rocking curves of extremely small angular width in the (nv, −nR)-position, and consequently increased sensibility of that width to lattice distortions, (2) Use of the extremely small angular width (or more strictly, the sharp θ-λ-coordination) of the beam emerging from a first crystal. This is in V-reflection for scanning the intrinsic diffraction pattern of the second crystal used in S- or V-reflection [(nv, −ns) or (nv, −nv) -position], (3) Increased steepness of the sides of the rocking curves using (nv, −nR) or (nv, −ns)-positions which allows double diffractometric topography (Bond-Andrus, Bonse-Kappler) of increased angular resolving power. (4) Repeated ^-reflections (eventually within a single crystal provided with a suitable groove) leading to further angular contraction of the resulting reflected beam and therefore further increased angular resolving power [(nv, −nv, nR, −nR)- and (nv, −nv, +nS)-positions]. Here the tails of the rocking curve are also suppressed by multiple reflection (Bonse-Hart).


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