Mechanics of Interaction and Atomic-Scale Wear of Amplitude Modulation Atomic Force Microscopy Probes

ACS Nano ◽  
2013 ◽  
Vol 7 (4) ◽  
pp. 3221-3235 ◽  
Author(s):  
Vahid Vahdat ◽  
David S. Grierson ◽  
Kevin T. Turner ◽  
Robert W. Carpick
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Atomic Scale ◽  
Force Microscopy ◽  
Atomic Force

Nano-Scale Forces, Stresses, and Tip Geometry Evolution of Amplitude Modulation Atomic Force Microscopy Probes

2011 ◽  
Author(s):  
Vahid Vahdat ◽  
David S. Grierson ◽  
Kevin T. Turner ◽  
Robert W. Carpick
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Interaction Model ◽  
Wear Test ◽  
Atomic Scale ◽  
Wear Volume ◽  
Microscopy Imaging ◽  
Wear Process ◽  
Force Microscopy ◽  
Atomic Force

Atomic-scale wear is one of the main factors that hinders the performance of probes for atomic force microscopy (AFM) [1–6], including for the widely-used amplitude modulation (AM-AFM) mode. To conduct consistent and quantitative AM-AFM wear experiments, we have developed a protocol that involves controlling the tip-sample interaction regime, calculating the maximum contact force and normal stress over the course of the wear test, and quantifying the wear volume using high-resolution transmission electron microscopy imaging (HR-TEM). The tip-sample interaction forces are estimated from a closed-form equation that uses the Derjaguin-Mu¨ller-Toporov interaction model (DMT) accompanied by a tip radius measurement algorithm known as blind tip reconstruction. The applicability of this new protocol is demonstrated experimentally by scanning silicon probes against ultrananocrystalline diamond (UNCD) samples. The wear process for the Si tip involved blunting of the tip due to tip fragmentation and plastic deformation. In addition, previous studies on the relative contributions of energy dissipation processes to AFM tip wear are reviewed, and initial steps are taken towards applying this concept to AM-AFM.

Correction to Mechanics of Interaction and Atomic-Scale Wear of Amplitude Modulation Atomic Force Microscopy Probes

ACS Nano ◽  
2013 ◽  
Vol 7 (11) ◽  
pp. 10435-10435 ◽  
Author(s):  
Vahid Vahdat ◽  
David S. Grierson ◽  
Kevin T. Turner ◽  
Robert W. Carpick
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Atomic Scale ◽  
Force Microscopy ◽  
Atomic Force

Visualization of molecular binding sites at the nanoscale in the lift-up mode by amplitude-modulation atomic force microscopy

Nanoscale ◽  
2021 ◽  
Vol 13 (7) ◽  
pp. 4213-4220
Author(s):  
Tatsuhiro Maekawa ◽  
Takashi Nyu ◽  
Evan Angelo Quimada Mondarte ◽  
Hiroyuki Tahara ◽  
Kasinan Suthiwanich ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Recognition ◽  
Amplitude Modulation ◽  
Binding Sites ◽  
Local Distribution ◽  
New Approach ◽  
Molecular Binding ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recognition Sites

We report a new approach to visualize the local distribution of molecular recognition sites with nanoscale resolution by amplitude-modulation atomic force microscopy.

Topographical changes in high-protein milk powders as a function of moisture sorption using amplitude-modulation atomic force microscopy.

2022 ◽  
pp. 107504
Author(s):  
Vinay S.N. Mishra ◽  
Tomasz J. Ochalski ◽  
Noel McCarthy ◽  
André Brodkorb ◽  
Brian J. Rodriguez ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Moisture Sorption ◽  
High Protein ◽  
Force Microscopy ◽  
Atomic Force ◽  
Protein Milk

Atomic Force Microscopy of Atomic-Scale Ledges and Etch Pits Formed During Dissolution of Quartz

Science ◽  
1991 ◽  
Vol 251 (4999) ◽  
pp. 1343-1346 ◽  
Author(s):  
A. J. GRATZ ◽  
S. MANNE ◽  
P. K. HANSMA
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Scale ◽  
Etch Pits ◽  
Force Microscopy ◽  
Atomic Force
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