Electron Scattering and Electrical Conductance in Polycrystalline Metallic Films and Wires: Impact of Grain Boundary Scattering Related to Melting Point

ACS Nano ◽  
2010 ◽  
Vol 4 (7) ◽  
pp. 3781-3788 ◽  
Author(s):  
Y. F. Zhu ◽  
X. Y. Lang ◽  
W. T. Zheng ◽  
Q. Jiang
Keyword(s):  
Melting Point ◽  
Grain Boundary ◽  
Electron Scattering ◽  
Electrical Conductance ◽  
Boundary Scattering ◽  
Metallic Films ◽  
Grain Boundary Scattering

scholarly journals Size Effects in Metallic Films

1978 ◽  
Vol 5 (2) ◽  
pp. 99-105 ◽  
Author(s):  
F. Warkusz
Keyword(s):  
Grain Boundary ◽  
Film Thickness ◽  
Size Effects ◽  
Approximate Expression ◽  
Surface Scattering ◽  
Boundary Scattering ◽  
Metallic Films ◽  
Grain Boundary Scattering ◽  
Grain Diameter

Based on the theories so far developed, an approximate expression for the resistivity of metallic films is derived, which takes into account film thickness, grain diameter, as well as the coefficients of surface scattering and grain boundary scattering. The derived formulae are compared with the results achieved by other authors.

scholarly journals Response to Comments on Paper on Grain Boundary Scattering Model for Metals

1981 ◽  
Vol 9 (2) ◽  
pp. 105-109 ◽  
Author(s):  
F. Warkusz
Keyword(s):  
Electrical Conductivity ◽  
Grain Boundary ◽  
Electron Scattering ◽  
Metal Film ◽  
External Surface ◽  
Surface Scattering ◽  
Boundary Scattering ◽  
Surface Electron ◽  
Polycrystalline Metal ◽  
Grain Boundary Scattering

The electrical conductivity of a polycrystalline metal film has been studied for a model in which the background scattering and grain boundary scattering are independent. The external surface electron scattering has been analyzed by assuming it to be independent of background scattering and thus the external surface scattering can be conveniently described with the Cottey method.

Thermal Conductivity of Thin Metallic Films

1994 ◽  
Vol 116 (1) ◽  
pp. 28-34 ◽  
Author(s):  
Sunil Kumar ◽  
George C. Vradis
Keyword(s):  
Experimental Data ◽  
Thermal Conductivity ◽  
Boltzmann Equation ◽  
Electron Transport ◽  
Temperature Gradient ◽  
Grain Boundary ◽  
Electron Scattering ◽  
Boundary Scattering ◽  
Electron Motion ◽  
Metallic Films

This study examines the effect of transverse thickness on the in-plane thermal conductivity of single crystal, defect-free, thin metallic films. The imposed temperature gradient is along the film and the transport of thermal energy is predominantly due to free electron motion. The small size necessitates an evaluation of the Boltzmann equation of electron transport along with appropriate electron scattering boundary conditions. Simple expressions for the reduction of conductivity due to increased dominance of boundary scattering are presented and the results are compared with other simplified approaches and experimental data from the literature. Grain boundary scattering is also considered via simple arguments.

Grain boundary scattering in Ru and Cu interconnects

2020 ◽  
Author(s):  
Troels Markussen ◽  
Shela Aboud ◽  
Anders Blom ◽  
Nicholas A. Lanzillo ◽  
Tue Gunst ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Boundary Scattering ◽  
Cu Interconnects ◽  
Grain Boundary Scattering

Coherent Phonon-Grain Boundary Scattering in Silicon Inverse Opals

Nano Letters ◽  
2013 ◽  
Vol 13 (2) ◽  
pp. 618-624 ◽  
Author(s):  
Jun Ma ◽  
Bibek R. Parajuli ◽  
Marc G. Ghossoub ◽  
Agustin Mihi ◽  
Jyothi Sadhu ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Boundary Scattering ◽  
Coherent Phonon ◽  
Inverse Opals ◽  
Grain Boundary Scattering

Effect of grain boundary scattering on the TCR of thin tin films

1983 ◽  
Vol 2 (7) ◽  
pp. 360-362 ◽  
Author(s):  
C. R. Pichard ◽  
Yu. F. Komnik ◽  
B. I. Belevtsev ◽  
A. J. Tosser
Keyword(s):  
Grain Boundary ◽  
Boundary Scattering ◽  
Tin Films ◽  
Grain Boundary Scattering

Enhancing the average thermoelectric figure of merit of elemental Te by suppressing grain boundary scattering

2020 ◽  
Vol 8 (17) ◽  
pp. 8455-8461 ◽  
Author(s):  
Yehao Wu ◽  
Feng Liu ◽  
Qi Zhang ◽  
Tiejun Zhu ◽  
Kaiyang Xia ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Grain Boundary ◽  
Thermoelectric Materials ◽  
Figure Of Merit ◽  
Thermoelectric Figure Of Merit ◽  
Boundary Scattering ◽  
Thermoelectric Figure ◽  
Grain Boundary Scattering

Suppressed grain boundary scattering contributes to enhanced electrical conductivity and device zT in elemental Te based thermoelectric materials.

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