scholarly journals Surface roughness and grain boundary scattering effects on the electrical conductivity of thin films

1998 ◽  
Vol 58 (15) ◽  
pp. 9685-9688 ◽  
Author(s):  
George Palasantzas
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Surface Roughness ◽  
Grain Boundary ◽  
Boundary Scattering ◽  
Grain Boundary Scattering ◽  
Scattering Effects ◽  
Conductivity Of Thin Films

Enhancing the average thermoelectric figure of merit of elemental Te by suppressing grain boundary scattering

2020 ◽  
Vol 8 (17) ◽  
pp. 8455-8461 ◽  
Author(s):  
Yehao Wu ◽  
Feng Liu ◽  
Qi Zhang ◽  
Tiejun Zhu ◽  
Kaiyang Xia ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Grain Boundary ◽  
Thermoelectric Materials ◽  
Figure Of Merit ◽  
Thermoelectric Figure Of Merit ◽  
Boundary Scattering ◽  
Thermoelectric Figure ◽  
Grain Boundary Scattering

Suppressed grain boundary scattering contributes to enhanced electrical conductivity and device zT in elemental Te based thermoelectric materials.

scholarly journals Surface and grain boundary scattering in nanometric Cu thin films: A quantitative analysis including twin boundaries

2014 ◽  
Vol 32 (6) ◽  
pp. 061503 ◽  
Author(s):  
Katayun Barmak ◽  
Amith Darbal ◽  
Kameswaran J. Ganesh ◽  
Paulo J. Ferreira ◽  
Jeffrey M. Rickman ◽  
...  
Keyword(s):  
Thin Films ◽  
Quantitative Analysis ◽  
Grain Boundary ◽  
Boundary Scattering ◽  
Twin Boundaries ◽  
Grain Boundary Scattering

Effects Of Grain Boundaries on the Resistivity of Cosputtered Wsi2 Films

1981 ◽  
Vol 10 ◽  
Author(s):  
D. R. Campbell ◽  
S. Mader ◽  
W. K. Chu
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Reflection Coefficient ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Charge Carriers ◽  
Boundary Scattering ◽  
Grain Boundary Scattering

ABSTRACTResistivity and grain size measurements on thin films of co-sputtered WSi2 show that the resistivity in this material is dominated by grain boundary scattering. The reflection coefficient for the transport of charge carriers through the grain boundaries was determined to be approximately 0.9.

scholarly journals Suppressed grain-boundary scattering in atomic layer deposited Nb:TiO2 thin films

2015 ◽  
Vol 107 (19) ◽  
pp. 192102 ◽  
Author(s):  
Janne-Petteri Niemelä ◽  
Yasushi Hirose ◽  
Kei Shigematsu ◽  
Masahito Sano ◽  
Tetsuya Hasegawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Atomic Layer ◽  
Boundary Scattering ◽  
Grain Boundary Scattering

Suppression of Grain Boundary Scattering in Multifunctional p-Type Transparent γ-CuI Thin Films due to Interface Tunneling Currents

2018 ◽  
Vol 5 (6) ◽  
pp. 1701411 ◽  
Author(s):  
Max Kneiß ◽  
Chang Yang ◽  
José Barzola-Quiquia ◽  
Gabriele Benndorf ◽  
Holger von Wenckstern ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Boundary Scattering ◽  
Grain Boundary Scattering ◽  
Tunneling Currents ◽  
P Type
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