Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy

Nano Letters ◽  
2014 ◽  
Vol 14 (4) ◽  
pp. 1903-1908 ◽  
Author(s):  
Ryo Ishikawa ◽  
Andrew R. Lupini ◽  
Scott D. Findlay ◽  
Takashi Taniguchi ◽  
Stephen J. Pennycook
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Three Dimensional ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Atomic Precision ◽  
Scanning Transmission ◽  
Aberration Corrected

Tomographic Imaging of Nanocrystals by Aberration-Corrected Scanning Transmission Electron Microscopy

2004 ◽  
Vol 839 ◽  
Author(s):  
Klaus van Benthem ◽  
Yiping Peng ◽  
Stephen J. Pennycook
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Three Dimensional ◽  
Atomic Scale ◽  
Scanning Transmission Electron ◽  
Depth Direction ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected

ABSTRACTIn aberration corrected scanning transmission electron microscopy, the depth of focus is of the order of a few nanometers, so that the three-dimensional shape of nanocrystals could so far not be determined with atomic resolution. Here we show that with the assistance of image simulations it is possible to achieve atomic-scale information in the depth direction by analyzing a through-focal series where the number of atoms in most columns can be determined by Z-contrast simulations. The error in this analysis is about two atoms in the thickest regions, and less in thinner regions.

scholarly journals Three-Dimensional Aberration-Corrected Scanning Transmission Electron Microscopy of Biological Specimens

2010 ◽  
Vol 16 (S2) ◽  
pp. 848-849 ◽  
Author(s):  
N de Jonge ◽  
R Ramachandra ◽  
BM Northan ◽  
N Poirier-Demers ◽  
D Drouin
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Three Dimensional ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

scholarly journals Optimized Deconvolution for Maximum Axial Resolution in Three-Dimensional Aberration-Corrected Scanning Transmission Electron Microscopy

2011 ◽  
Vol 18 (1) ◽  
pp. 218-228 ◽  
Author(s):  
Ranjan Ramachandra ◽  
Niels de Jonge
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Structural Information ◽  
Three Dimensional ◽  
Axial Resolution ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected

AbstractThree-dimensional (3D) datasets were recorded of gold nanoparticles placed on both sides of silicon nitride membranes using focal series aberration-corrected scanning transmission electron microscopy (STEM). Deconvolution of the 3D datasets was applied to obtain the highest possible axial resolution. The deconvolution involved two different point spread functions, each calculated iteratively via blind deconvolution. Supporting membranes of different thicknesses were tested to study the effect of beam broadening on the deconvolution. It was found that several iterations of deconvolution was efficient in reducing the imaging noise. With an increasing number of iterations, the axial resolution was increased, and most of the structural information was preserved. Additional iterations improved the axial resolution by maximal a factor of 4 to 6, depending on the particular dataset, and up to 8 nm maximal, but also led to a reduction of the lateral size of the nanoparticles in the image. Thus, the deconvolution procedure optimized for the highest axial resolution is best suited for applications where one is interested in the 3D locations of nanoparticles only.

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