scholarly journals Molecular Orientation Affects Localization Accuracy in Superresolution Far-Field Fluorescence Microscopy

Nano Letters ◽  
2011 ◽  
Vol 11 (1) ◽  
pp. 209-213 ◽  
Author(s):  
Johann Engelhardt ◽  
Jan Keller ◽  
Patrick Hoyer ◽  
Matthias Reuss ◽  
Thorsten Staudt ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Molecular Orientation ◽  
Far Field ◽  
Localization Accuracy

scholarly journals Axial localization and tracking of self-interference nanoparticles by lateral point spread functions

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Yongtao Liu ◽  
Zhiguang Zhou ◽  
Fan Wang ◽  
Günter Kewes ◽  
Shihui Wen ◽  
...  
Keyword(s):  
Mirror Image ◽  
Excitation Wavelength ◽  
Far Field ◽  
Point Spread Functions ◽  
Microscopy Imaging ◽  
Localization Accuracy ◽  
Field Patterns ◽  
Atomic Force ◽  
Point Spread ◽  
Sensing Technology

AbstractSub-diffraction limited localization of fluorescent emitters is a key goal of microscopy imaging. Here, we report that single upconversion nanoparticles, containing multiple emission centres with random orientations, can generate a series of unique, bright and position-sensitive patterns in the spatial domain when placed on top of a mirror. Supported by our numerical simulation, we attribute this effect to the sum of each single emitter’s interference with its own mirror image. As a result, this configuration generates a series of sophisticated far-field point spread functions (PSFs), e.g. in Gaussian, doughnut and archery target shapes, strongly dependent on the phase difference between the emitter and its image. In this way, the axial locations of nanoparticles are transferred into far-field patterns. We demonstrate a real-time distance sensing technology with a localization accuracy of 2.8 nm, according to the atomic force microscope (AFM) characterization values, smaller than 1/350 of the excitation wavelength.

scholarly journals Improved localization accuracy in stochastic super-resolution fluorescence microscopy by K-factor image deshadowing

2013 ◽  
Vol 5 (1) ◽  
pp. 244 ◽  
Author(s):  
Tali Ilovitsh ◽  
Amihai Meiri ◽  
Carl G. Ebeling ◽  
Rajesh Menon ◽  
Jordan M. Gerton ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Super Resolution ◽  
Localization Accuracy ◽  
K Factor

Two-Point Separation in Far-Field Super-Resolution Fluorescence Microscopy Based on Two-Color Fluorescence Dip Spectroscopy, Part I: Experimental Evaluation

2005 ◽  
Vol 59 (7) ◽  
pp. 868-872 ◽  
Author(s):  
Takeshi Watanabe ◽  
Yoshinori Iketaki ◽  
Takashige Omatsu ◽  
Kimihisa Yamamoto ◽  
Masaaki Fujii
Keyword(s):  
Fluorescence Microscopy ◽  
Phase Modulation ◽  
Laser Light ◽  
Super Resolution ◽  
Separation Distance ◽  
Diffraction Limit ◽  
Far Field ◽  
Fluorescent Beads ◽  
Fluorescent Image ◽  
Point Separation

The two-point resolution of a novel two-color far-field super-resolution fluorescence microscopy was evaluated by measuring fluorescent beads 100 nm in diameter. This microscopy is based on a combination of two-color fluorescence dip spectroscopy and a phase-modulation technique for a laser beam. By simply introducing two-color laser light, the size of the fluorescent image of a bead was shrunk down to a diameter of 250 nm from the diffraction-limited image with a diameter of 360 nm. For two closely adjacent fluorescent beads with a separation distance of 350 nm, the two-color microscope clearly gave separated fluorescence images, while the conventional one-color fluorescence microscope could not resolve them. It has been proved that our technique breaks Rayleigh's diffraction limit.

Far-field fluorescence microscopy at the macromolecular scale

2006 ◽  
Author(s):  
S. W. Hell ◽  
K. Willig ◽  
M. Hofmann ◽  
C. Eggeling ◽  
V. Westphal
Keyword(s):  
Fluorescence Microscopy ◽  
Far Field

scholarly journals Simultaneous near-field and far-field fluorescence microscopy of single molecules

2011 ◽  
Vol 19 (7) ◽  
pp. 6836 ◽  
Author(s):  
Thomas Ruckstuhl ◽  
Dorinel Verdes ◽  
Christian M. Winterflood ◽  
Stefan Seeger
Keyword(s):  
Fluorescence Microscopy ◽  
Near Field ◽  
Single Molecules ◽  
Far Field

Parallel two-channel near- and far-field fluorescence microscopy

2007 ◽  
Vol 12 (3) ◽  
pp. 034012 ◽  
Author(s):  
Dorinel Verdes ◽  
Thomas Ruckstuhl ◽  
Stefan Seeger
Keyword(s):  
Fluorescence Microscopy ◽  
Far Field

scholarly journals Near-Field IR Orientational Spectroscopy of Silk

2019 ◽  
Author(s):  
Meguya Ryu ◽  
Reo Honda ◽  
Aina Reich ◽  
Adrian Cernescu ◽  
Jing-Liang Li ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Spatial Resolution ◽  
Cross Sections ◽  
Molecular Orientation ◽  
Near Field ◽  
Beta Sheets ◽  
Far Field ◽  
Absorbance Measurement

Orientational dependence of the IR absorbing amide bands of silk is demonstrated from two orthogonal longitudinal and transverse microtome slices only $\sim 100$~nm thick. A scanning near-field optical microscopy (SNOM) which preferentially probes orientation perpendicular to the sample's surface was used. Spatial resolution of silk-epoxy boundary was defined with a $\sim 100$~nm resolution while the spectra were collected by a $\sim 10$~nm tip. Ratio of the absorbance of the amide-II C-N at 1512~cm$^{-1}$ and amide-I C=O $\beta$-sheets at 1628~cm$^{-1}$ showed sensitivity of SNOM to the molecular orientation. SNOM characterisation is complimentary to the far-field absorbance which is sensitive to the in-plane polarisation. Volumes with cross sections smaller than 100~nm can be characterised for molecular orientation. A method of absorbance measurements at four angles of slice cut orientation, which is equivalent to the four polarisation angles absorbance measurement is proposed.

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