Charge Trapping in Carbon Nanotube Loops Demonstrated by Electrostatic Force Microscopy

Nano Letters ◽  
2005 ◽  
Vol 5 (9) ◽  
pp. 1838-1841 ◽  
Author(s):  
Thomas Sand Jespersen ◽  
Jesper Nygård
Keyword(s):  
Carbon Nanotube ◽  
Electrostatic Force ◽  
Charge Trapping ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

scholarly journals Electrostatic force microscopy analysis of Bi0.7Dy0.3FeO3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications

2018 ◽  
Vol 4 (2) ◽  
pp. 77-85
Author(s):  
Deepak Bhatia ◽  
Sandipta Roy ◽  
S. Nawaz ◽  
R.S. Meena ◽  
V.R. Palkar
Keyword(s):  
Thin Films ◽  
Electrical Transport ◽  
Microelectromechanical Systems ◽  
Electrostatic Force ◽  
Charge Trapping ◽  
Electrostatic Force Microscopy ◽  
Zno Films ◽  
Phase Dependence ◽  
Force Microscopy ◽  
Electric Charge Distribution

In this paper, we report the charge trapping phenomena in zinc oxide (n-ZnO) and Bi0.7Dy0.3FeO3 (BDFO)/ZnO thin films deposited on p-type <100> conducting Si substrate. The significant change in contrast above the protrusions of ZnO verifies the possibility of heavy accumulation of injected holes in there. The ZnO and BDFO/ZnO films were characterized by the electrostatic force microscopy (EFM) to understand the phase dependence phenomenon on the bias supporting electron tunnelling. The EFM has an important role in the analysis of electrical transport mechanism characterization and electric charge distribution of local surface in nanoscale devices. It was observed that in BDFO/ZnO, the contrast of EFM images remains constant with the bias switching and that primarily indicates availability of trap sites to host electrons. The change in contrast over the protrusions of ZnO suggests that mobility of the electrical charge carriers may be through the grain boundary. The formation of these hole-trapped sites may be assumed by bond breaking phenomenon.

POTENTIAL PROFILE MEASUREMENT OF CARBON NANOTUBE FETs BASED ON THE ELECTROSTATIC FORCE DETECTION

NANO ◽  
2008 ◽  
Vol 03 (01) ◽  
pp. 51-54 ◽  
Author(s):  
YUKI OKIGAWA ◽  
TAKEO UMESAKA ◽  
YUTAKA OHNO ◽  
SHIGERU KISHIMOTO ◽  
TAKASHI MIZUTANI
Keyword(s):  
Carbon Nanotube ◽  
Field Effect ◽  
Potential Distribution ◽  
Field Effect Transistors ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Profile Measurement ◽  
Kelvin Probe ◽  
Force Detection ◽  
Force Microscopy

We have measured the potential distribution on carbon nanotube (CNT) field-effect transistors (FETs) using electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KFM). Clearer potential profiles were obtained by EFM than by KFM. When the CNT-FET is in the ON state, the EFM image shows uniform potential distribution along the CNT. In contrast, when the CNT-FET is in the OFF state, nonuniform potential image with dark spots are obtained. The dark spots can be attributed to the defects in the CNTs.

Carbon nanotube-modified cantilevers for improved spatial resolution in electrostatic force microscopy

1999 ◽  
Vol 75 (18) ◽  
pp. 2842-2844 ◽  
Author(s):  
S. B. Arnason ◽  
A. G. Rinzler ◽  
Q. Hudspeth ◽  
A. F. Hebard
Keyword(s):  
Carbon Nanotube ◽  
Spatial Resolution ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

scholarly journals Imaging latex–carbon nanotube composites by subsurface electrostatic force microscopy

2016 ◽  
Vol 27 (41) ◽  
pp. 415705 ◽  
Author(s):  
Sajan Patel ◽  
Clayton W Petty ◽  
Karen Krafcik ◽  
Bryan Loyola ◽  
Greg O’Bryan ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Nanotube Composites ◽  
Carbon Nanotube Composites

Study of Charge Diffusion at the Carbon Nanotube−SiO2 Interface by Electrostatic Force Microscopy

2009 ◽  
Vol 113 (35) ◽  
pp. 15476-15479 ◽  
Author(s):  
Yingran He ◽  
Hock Guan Ong ◽  
Yang Zhao ◽  
Sailing He ◽  
Lain-Jong Li ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

scholarly journals Two-dimensional dopant profiling by electrostatic force microscopy using carbon nanotube modified cantilevers

2008 ◽  
Vol 19 (32) ◽  
pp. 325703 ◽  
Author(s):  
Shu-Cheng Chin ◽  
Yuan-Chih Chang ◽  
Chen-Chih Hsu ◽  
Wei-Hsiang Lin ◽  
Chih-I Wu ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Two Dimensional ◽  
Dopant Profiling ◽  
Force Microscopy
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