Study of Charge Diffusion at the Carbon Nanotube−SiO2 Interface by Electrostatic Force Microscopy

2009 ◽  
Vol 113 (35) ◽  
pp. 15476-15479 ◽  
Author(s):  
Yingran He ◽  
Hock Guan Ong ◽  
Yang Zhao ◽  
Sailing He ◽  
Lain-Jong Li ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

POTENTIAL PROFILE MEASUREMENT OF CARBON NANOTUBE FETs BASED ON THE ELECTROSTATIC FORCE DETECTION

NANO ◽  
2008 ◽  
Vol 03 (01) ◽  
pp. 51-54 ◽  
Author(s):  
YUKI OKIGAWA ◽  
TAKEO UMESAKA ◽  
YUTAKA OHNO ◽  
SHIGERU KISHIMOTO ◽  
TAKASHI MIZUTANI
Keyword(s):  
Carbon Nanotube ◽  
Field Effect ◽  
Potential Distribution ◽  
Field Effect Transistors ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Profile Measurement ◽  
Kelvin Probe ◽  
Force Detection ◽  
Force Microscopy

We have measured the potential distribution on carbon nanotube (CNT) field-effect transistors (FETs) using electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KFM). Clearer potential profiles were obtained by EFM than by KFM. When the CNT-FET is in the ON state, the EFM image shows uniform potential distribution along the CNT. In contrast, when the CNT-FET is in the OFF state, nonuniform potential image with dark spots are obtained. The dark spots can be attributed to the defects in the CNTs.

Carbon nanotube-modified cantilevers for improved spatial resolution in electrostatic force microscopy

1999 ◽  
Vol 75 (18) ◽  
pp. 2842-2844 ◽  
Author(s):  
S. B. Arnason ◽  
A. G. Rinzler ◽  
Q. Hudspeth ◽  
A. F. Hebard
Keyword(s):  
Carbon Nanotube ◽  
Spatial Resolution ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

scholarly journals Imaging latex–carbon nanotube composites by subsurface electrostatic force microscopy

2016 ◽  
Vol 27 (41) ◽  
pp. 415705 ◽  
Author(s):  
Sajan Patel ◽  
Clayton W Petty ◽  
Karen Krafcik ◽  
Bryan Loyola ◽  
Greg O’Bryan ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Nanotube Composites ◽  
Carbon Nanotube Composites

scholarly journals Two-dimensional dopant profiling by electrostatic force microscopy using carbon nanotube modified cantilevers

2008 ◽  
Vol 19 (32) ◽  
pp. 325703 ◽  
Author(s):  
Shu-Cheng Chin ◽  
Yuan-Chih Chang ◽  
Chen-Chih Hsu ◽  
Wei-Hsiang Lin ◽  
Chih-I Wu ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Two Dimensional ◽  
Dopant Profiling ◽  
Force Microscopy
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