scholarly journals In Situ Observation of a Self-Assembled Monolayer Formation of Octadecyltrimethoxysilane on a Silicon Oxide Surface Using a High-Speed Atomic Force Microscope

2016 ◽  
Vol 120 (5) ◽  
pp. 2807-2813 ◽  
Author(s):  
Junji Iwasa ◽  
Kazuhisa Kumazawa ◽  
Kazumasa Aoyama ◽  
Hiroshi Suzuki ◽  
Shingo Norimoto ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
High Speed ◽  
Silicon Oxide ◽  
Oxide Surface ◽  
In Situ Observation ◽  
Self Assembled Monolayer ◽  
Monolayer Formation ◽  
Atomic Force ◽  
Self Assembled

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals In situ observation of streptavidin-biotin binding on an immunoassay well surface using an atomic force microscope

FEBS Letters ◽  
1996 ◽  
Vol 390 (2) ◽  
pp. 161-164 ◽  
Author(s):  
S. Allen ◽  
J. Davies ◽  
A.C. Dawkes ◽  
M.C. Davies ◽  
J.C. Edwards ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
In Situ Observation ◽  
Atomic Force ◽  
Biotin Binding

Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope

1994 ◽  
Vol 33 (Part 1, No. 1B) ◽  
pp. 379-382 ◽  
Author(s):  
Yoshinobu Fukano ◽  
Takayuki Uchihashi ◽  
Takahiro Okusako ◽  
Ayumi Chayahara ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Time Evolution ◽  
Silicon Oxide ◽  
Oxide Surface ◽  
Atomic Force

Self-assembled monolayer and multilayer formation using redox-active Ru complex with phosphonic acids on silicon oxide surface

2009 ◽  
Vol 255 (21) ◽  
pp. 8824-8830 ◽  
Author(s):  
Takao Ishida ◽  
Kei-ichi Terada ◽  
Kiichi Hasegawa ◽  
Hironao Kuwahata ◽  
Kazunori Kusama ◽  
...  
Keyword(s):  
Silicon Oxide ◽  
Oxide Surface ◽  
Self Assembled Monolayer ◽  
Phosphonic Acids ◽  
Ru Complex ◽  
Redox Active ◽  
Self Assembled ◽  
Multilayer Formation
Sign in / Sign up

Export Citation Format

Share Document