Early Stage Phase Separation in Pharmaceutical Solid Dispersion Thin Films under High Humidity: Improved Spatial Understanding Using Probe-Based Thermal and Spectroscopic Nanocharacterization Methods

2013 ◽  
Vol 10 (3) ◽  
pp. 918-930 ◽  
Author(s):  
Sheng Qi ◽  
Jonathan G. Moffat ◽  
Ziyi Yang
2011 ◽  
Vol 84 (15) ◽  
Author(s):  
S. G. Altendorf ◽  
A. Efimenko ◽  
V. Oliana ◽  
H. Kierspel ◽  
A. D. Rata ◽  
...  
Keyword(s):  

1997 ◽  
Vol 481 ◽  
Author(s):  
Celeste Sagui ◽  
Dean Stinson O'Gorman ◽  
Martin Grant

ABSTRACTIn this work we have re-examined the classical problem of nucleation and growth. A new model considers the correlations among droplets and naturally incorporates the crossover from the early-stage, nucleation dominated regime to the scaling, late-stage, coarsening regime within a single framework.


1999 ◽  
Vol 14 (7) ◽  
pp. 2905-2911 ◽  
Author(s):  
Sangsub Kim ◽  
Tae Soo Kang ◽  
Jung Ho Je

Epitaxial (Ba0.5Sr0.5) TiO3 thin films of two different thickness (∼25 and ∼134 nm) on MgO(001) prepared by a pulsed laser deposition method were studied by synchrotron x-ray scattering measurements. The film grew initially with a cube-on-cube relationship, maintaining it during further growth. As the film grew, the surface of the film became significantly rougher, but the interface between the film and the substrate did not. In the early stage of growth, the film was highly strained in a tetragonal structure (c/a = 1.04) with the longer axis parallel to the surface normal direction. As the growth proceeded further, it relaxed to a cubic structure with the lattice parameter near the bulk value, and the mosaic distribution improved significantly in both in- and out-of-plane directions. The thinner film (∼25 nm) showed only one domain limited mainly by the film thickness, but the thicker film (∼134 nm) exhibited three domains along the surface normal direction.


2012 ◽  
Vol 3 (6) ◽  
pp. 683-688 ◽  
Author(s):  
Matthias A. Ruderer ◽  
Robert Meier ◽  
Lionel Porcar ◽  
Robert Cubitt ◽  
Peter Müller-Buschbaum

2001 ◽  
Vol 670 ◽  
Author(s):  
Akira Nishiyama ◽  
Akio Kaneko ◽  
Masato Koyama ◽  
Yoshiki Kamata ◽  
Ikuo Fujiwara ◽  
...  

ABSTRACTTi-Si-O films were sputter deposited from TiO2+SiO2 composite targets with various SiO2 content. The phase separation occurred for every SiO2 content used in this experiment (from 14% to 75%) and it has been revealed that nanocrystalline (TiO2)1-x(SiO2)x films in which anatase TiO2 forms tiny grains were obtained when x in the film is larger than 0.26. The tiny grain was effective for suppressing the thermal grooving phenomenon of the thin films by the post deposition annealing which leads to the leakage current increase. The dielectric constant of the nanocrystalline film was varied with the SiO2 content from the value of the bulk anatase to SiO2.


2000 ◽  
Vol 332 (1-4) ◽  
pp. 207-213 ◽  
Author(s):  
J. Jung ◽  
H. Yan ◽  
H. Darhmaoui ◽  
W.K. Kwok

1996 ◽  
Vol 441 ◽  
Author(s):  
Sung-Tae Kim ◽  
Hyun-Ho Kim ◽  
Moon-Yong Lee ◽  
Won-Jong Lee

AbstractPerovskite-phase lead zirconate titanate (PZT) thin films were fabricated at 4751C by the electron cyclotron resonance (ECR) plasma enhanced DC magnetron multi-target reactive sputtering method on Pt/Ti/SiO2/Si and Pt/SiO2/Si substrates. Stoichiometric perovskite PZT films were readily obtained on Pt/Ti/SiO2/Si substrates because Ti atoms which were out-diffused to the Pt surface facilitated Pb incorporation by forming lead titanate at the early stage of deposition process. Activation of oxygen by ECR plasma facilitated the oxidation reaction and Pb incorporation into the film. Thus perovskite-phase PZT can be obtained on the Pt/SiO2/Si substrate.


2020 ◽  
Vol 190 ◽  
pp. 110967 ◽  
Author(s):  
Russell A. Banta ◽  
Timothy W. Collins ◽  
Ricky Curley ◽  
John O'Connell ◽  
Paul W. Young ◽  
...  

Langmuir ◽  
2019 ◽  
Vol 35 (11) ◽  
pp. 4011-4019 ◽  
Author(s):  
Dowan Kim ◽  
Donghyo Hahm ◽  
Soonhyoung Kwon ◽  
Jeewoo Lim ◽  
Kookheon Char

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