Temperature Induced Structure Evolution of Regioregular Poly(3-hexylthiophene) in Dilute Solution and its Influence on Thin Film Morphology

2010 ◽  
Vol 43 (23) ◽  
pp. 10031-10037 ◽  
Author(s):  
Ye Huang ◽  
He Cheng ◽  
Charles C. Han
Keyword(s):  
Thin Film ◽  
Structure Evolution ◽  
Film Morphology ◽  
Dilute Solution ◽  
Regioregular Poly ◽  
Induced Structure

Influence of molecular weight on polymorphs and temperature-induced structure evolution of regioregular poly(3-dodecylthiophene)

2014 ◽  
Vol 5 (6) ◽  
pp. 1938-1944 ◽  
Author(s):  
Yan Guo ◽  
Lei Wang ◽  
Yuanyuan Han ◽  
Yanhou Geng ◽  
Zhaohui Su
Keyword(s):  
Molecular Weight ◽  
Structure Evolution ◽  
Regioregular Poly ◽  
Induced Structure

The importance of spinning speed in fabrication of spin-coated organic thin film transistors: Film morphology and field effect mobility

2014 ◽  
Vol 104 (23) ◽  
pp. 233306 ◽  
Author(s):  
Kenji Kotsuki ◽  
Hiroshige Tanaka ◽  
Seiji Obata ◽  
Sven Stauss ◽  
Kazuo Terashima ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Field Effect ◽  
Organic Thin Film Transistors ◽  
Film Morphology ◽  
Organic Thin Film ◽  
Field Effect Mobility ◽  
Spinning Speed

Reactive Phase Formation in Thin Films: Evolution of Grain Structure

1995 ◽  
Vol 403 ◽  
Author(s):  
K. Barmak ◽  
C. Michaelsent ◽  
J. Rickman ◽  
M. Dahmstt
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Phase Formation ◽  
Experimental Studies ◽  
Grain Structure ◽  
Structure Evolution ◽  
Future Research ◽  
Polycrystalline Materials ◽  
Product Phase ◽  
Nucleation Kinetics

AbstractIt is a well known fact that the properties and performance of polycrystalline materials, including polycrystalline thin films, are strongly affected by the grain structure. Therefore, in treating reactive phase formation in these films, it is (or it will inevitably be) necessary to quantify the grain structure of reactant and product phases and its evolution during the course of the reaction. Theoretical models and the conventional view of thin film reactions, however, have been largely extensions, to small and finite dimensions, of theories and descriptions developed for bulk diffusion couples. These models and descriptions primarily focus on the growth stage and to a much lesser extent on the nucleation stage. Consequently, these models and descriptions are not able to treat the development of product phase grain structure. Recent calorimetric investigations of several thin film systems demonstrate the importance of nucleation kinetics (and hence nucleation barriers) in product phase formation and provide quantitative measures of the thermodynamics and kinetics of formation of the product phases, thereby allowing some degree of comparison with reaction models. Furthermore, microstructural investigations of thin-film reactions demonstrate the non-planarity of the growth front and highlight the role of reactant-phase grain boundaries. In this paper, a summary of these experimental studies and recent theoretical treatments, which combine nucleation and growth in an integrated manner, is presented, with particular emphasis on the Nb/Al system. These experiments and models lead to a new view of reactive phase formation and grain structure evolution as one in which the latter is an integral part of the former. Based on this view, directions for future research are discussed.

Improvement of Cu2ZnSnS4 thin film morphology using Cu–Zn–Sn–O precursor fabricated by sputtering

2013 ◽  
Vol 13 (9) ◽  
pp. 1861-1864 ◽  
Author(s):  
Ryo Ishino ◽  
Kazuhiro Fukushima ◽  
Takashi Minemoto
Keyword(s):  
Thin Film ◽  
Film Morphology ◽  
Cu2znsns4 Thin Film

scholarly journals Synthesis, Thermal Processing, and Thin Film Morphology of Poly(3-hexylthiophene)–Poly(styrenesulfonate) Block Copolymers

2015 ◽  
Vol 48 (7) ◽  
pp. 2107-2117 ◽  
Author(s):  
Harikrishna Erothu ◽  
Joanna Kolomanska ◽  
Priscilla Johnston ◽  
Stefan Schumann ◽  
Dargie Deribew ◽  
...  
Keyword(s):  
Thin Film ◽  
Block Copolymers ◽  
Thermal Processing ◽  
Film Morphology

Detection of reactions and changes in thin film morphology using stress measurements

1992 ◽  
Vol 10 (4) ◽  
pp. 1426-1441 ◽  
Author(s):  
Donald S. Gardner ◽  
Hai P. Longworth ◽  
Paul A. Flinn
Keyword(s):  
Thin Film ◽  
Film Morphology ◽  
Stress Measurements
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