Characterization of Reactive Dissolution and Swelling of Polymer Films Using a Quartz Crystal Microbalance and Visible and Infrared Reflectance Spectroscopy

2005 ◽  
Vol 38 (5) ◽  
pp. 1882-1898 ◽  
Author(s):  
W. Hinsberg ◽  
F. A. Houle ◽  
S.-W. Lee ◽  
H. Ito ◽  
K. Kanazawa
Keyword(s):  
Quartz Crystal Microbalance ◽  
Polymer Films ◽  
Quartz Crystal ◽  
Reflectance Spectroscopy ◽  
Infrared Reflectance ◽  
Infrared Reflectance Spectroscopy ◽  
Reactive Dissolution

Characterization of Hydrated Surface Layers on Nuclear Waste Glasses by Infrared Reflectance Spectroscopy

1984 ◽  
Vol 44 ◽  
Author(s):  
Lauren A. Zellmer ◽  
William B. White
Keyword(s):  
Reflectance Spectroscopy ◽  
Infrared Reflectance ◽  
Borosilicate Glasses ◽  
Surface Layers ◽  
Degree Of Hydration ◽  
Infrared Reflectance Spectroscopy ◽  
Specular Reflectance ◽  
Waste Immobilization ◽  
Alkali Silicate Glass

AbstractThe reaction between aqueous solutions and borosilicate glasses designed for commercial or defense waste immobilization produces a hydrated layer on the surface of the glass which can be characterized by infrared reflectance spectroscopy. Specular reflectance curves, obtained by Fourier transform infrared spectroscopy, can be deconvoluted by Kramers-Kronig analysis to obtain true absorption spectra. The pattern of Si-O stretching modes changes for alkali silicate glass, indicating changes in the network polymerization. The characteristic intense band of the borosilicate glasses simply changes intensity in a way that scales with degree of hydration. The progressive hydration of the glass surface also appears as a broad OH band which can be extracted from the reflectance curve by the deconvolution process.

Characterization of 4H—SiC substrates and epilayers by Fourier transform infrared reflectance spectroscopy

2012 ◽  
Vol 21 (4) ◽  
pp. 047802 ◽  
Author(s):  
Lin Dong ◽  
Guo-Sheng Sun ◽  
Liu Zheng ◽  
Xing-Fang Liu ◽  
Feng Zhang ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Fourier Transform Infrared ◽  
Reflectance Spectroscopy ◽  
Infrared Reflectance ◽  
Infrared Reflectance Spectroscopy

Characterization of Carrier Concentration and Mobility in n-type SiC Wafers Using Infrared Reflectance Spectroscopy

2004 ◽  
Vol 43 (8A) ◽  
pp. 5151-5156 ◽  
Author(s):  
Katsutoshi Narita ◽  
Yasuto Hijikata ◽  
Hiroyuki Yaguchi ◽  
Sadafumi Yoshida ◽  
Shinichi Nakashima
Keyword(s):  
Carrier Concentration ◽  
Reflectance Spectroscopy ◽  
Infrared Reflectance ◽  
Infrared Reflectance Spectroscopy
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