Kinetics of Surface Phase Separation for PMMA/SAN Thin Films Studied by in Situ Atomic Force Microscopy

2005 ◽  
Vol 38 (2) ◽  
pp. 211-215 ◽  
Author(s):  
Yonggui Liao ◽  
Zhaohui Su ◽  
Xianggui Ye ◽  
Yunqi Li ◽  
Jichun You ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Surface Phase ◽  
Force Microscopy ◽  
Atomic Force ◽  
Kinetics Of

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Atomic force microscopy studies of ZnS films grown on (100) GaAs by the successive ionic layer adsorption and reaction method

1998 ◽  
Vol 13 (6) ◽  
pp. 1688-1692 ◽  
Author(s):  
Mika P. Valkonen ◽  
Seppo Lindroos ◽  
Tapio Kanniainen ◽  
Markku Leskelä ◽  
Roland Resch ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Force Microscopy ◽  
Atomic Force ◽  
Layer Adsorption ◽  
Silar Technique ◽  
Ionic Layer

In this study zinc sulfide thin films were grown by the successive ionic layer adsorption and reaction (SILAR) technique on (100) GaAs substrates from aqueous precursor solutions. The atomic force microscopy (AFM) method was used to study the growth of the films up to a thickness of 180 nm. The ZnS thin films on (100) GaAs were smooth with an rms roughness of 0.2–1.9 nm depending on the film thickness. After the GaAs surface was covered with ZnS, the growth appeared to be nearly layerwise. In addition, in situ AFM studies were carried out to analyze the dissolution of (100) GaAs in water, which is a process competing with the thin film deposition by the SILAR.

Effects of nanoparticles on phase morphology in thin films of phase-separated diblock copolymers

2017 ◽  
Vol 32 (S1) ◽  
pp. S141-S150
Author(s):  
Dieter Jehnichen ◽  
Doris Pospiech ◽  
Peter Friedel ◽  
Andriy Horechyy ◽  
Andreas Korwitz ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Diblock Copolymers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Gold Silver ◽  
Lateral Distance ◽  
Morphology Changes ◽  
Periodic Nanostructure

This study investigates the morphology changes in thin diblock copolymer (DiBCP) films occurring in the interaction with modified nanoparticles (NPs). Magnetite (Fe3O4) and silica (SiOx) were prepared and used. Poly(pentyl methacrylate-b-methyl methacrylate) (PPMA-b-PMMA) (70/30 mol mol−1, hcp cylinders of the PMMA phase) DiBCP were employed to prepare thin films having thicknesses to realize standing cylinders in pure DiBCP films. The investigations aimed at two topics: (1) morphology after controlled incorporation of organo-modified NP (gold, silver, Fe3O4, SiOx) and (2) additional solvent vapour annealing (SVA) with tetrahydrofuran (and chloroform for comparison). The laterally ordered morphology in thin films was examined by GISAXS and atomic force microscopy. Keeping the same type of morphology in nanocomposites, the dimensions of the periodic nanostructure altered depending on type and amount of incorporated NP. It was found that SiOx clusters enlarge the lateral distance of the PMMA cylinders, whereas metallic NPs reduce this parameter. Applying SVA improves the phase separation slightly, whereas lateral distances were kept constant or were reduced a little. Switching of domain orientation upon SVA could not be detected in the presence of NPs located at the polymer/substrate interface.

Phase separation in SiO2–TiO2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy

2001 ◽  
Vol 16 (6) ◽  
pp. 1626-1631 ◽  
Author(s):  
A. Karthikeyan ◽  
Rui M. Almeida
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Sol Gel ◽  
Force Microscopy ◽  
Pure Silica ◽  
Atomic Force ◽  
Transmission Electron

An investigation of phase separation phenomena in gel and glassy thin films of silica–titania, with TiO2 contents of 20 and 40 mol%, has been carried out by atomic force microscopy (AFM) and transmission electron microscopy (TEM). The thin films were prepared by spin coating of a precursor sol on silicon wafers. Both the TEM measurements (carried out on scrapped thin film flakes) and the AFM measurements (carried out on films coated on the silicon substrates) for samples with different heat treatments suggest that spinodal-like structural inhomogeneities occur in these samples, unlike the corresponding observations in pure silica films, which are known to be homogeneous. Changes in the microstructure of the films have been noticed with the thermal treatment, in agreement with earlier x-ray photoemission studies. The finer characteristic dimensions of the phase separated regions reveal that silica–titania samples prepared by sol-gel processing exhibit a more intimate mixing of the phases.

Morphological Evolution of Chloroaluminum Phthalocyanine Thin Films Followed in situ by Atomic Force Microscopy

1995 ◽  
Vol 99 (47) ◽  
pp. 17198-17206 ◽  
Author(s):  
F. Santerre ◽  
R. Cote ◽  
G. Lalande ◽  
L. Gastonguay ◽  
D. Guay ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Morphological Evolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Chloroaluminum Phthalocyanine

scholarly journals Tuning and in situ monitoring of surface-initiated, atom-transfer radical polymerization of acrylamide derivatives in water-based solvents

2019 ◽  
Vol 10 (29) ◽  
pp. 3933-3942 ◽  
Author(s):  
Joydeb Mandal ◽  
Rok Simic ◽  
Nicholas D. Spencer
Keyword(s):  
Atomic Force Microscopy ◽  
Quartz Crystal ◽  
Polymer Brush ◽  
In Situ Monitoring ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Water Based ◽  
Kinetics Of

SI-ATRP kinetics of acrylamide derivatives is studied in situ using a quartz crystal microbalance with dissipation (QCM-D). The effect of growth kinetics on polymer-brush dispersity have been examined using colloidal-probe atomic force microscopy.

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