Atomic Force Microscopy Visualization of Morphology Changes Resulting from the Phase Transitions in Poly(di-n-alkylsiloxane)s:  Poly(diethylsiloxane)

2001 ◽  
Vol 34 (4) ◽  
pp. 976-990 ◽  
Author(s):  
Yuli K. Godovsky ◽  
Vladimir S. Papkov ◽  
Sergei N. Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Transitions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphology Changes

scholarly journals Quantitative atomic force microscopy measurements of Acinetobacter morphology

2020 ◽  
Author(s):  
C. Phoebe Lostroh ◽  
Caroline M. Boyd ◽  
Nicholas Lammers ◽  
Kaleb S. Roush ◽  
Sara L. Worsham ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Growth Curve ◽  
Cell Shape ◽  
Nanometer Scale ◽  
Growth Media ◽  
Wild Type ◽  
Acinetobacter Baylyi ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphology Changes

Abstract Acinetobacter baylyi are variously reported as spherical or rod-shaped. Here we use atomic force microscopy (AFM) to make quantitative nanometer-scale measurements of cellular length and width for thousands of individual cells. We quantify the heterogeneity of populations grown in varying environmental conditions that dramatically affect cell shape. In particular, we look at morphology changes across a growth curve, and we examine cells from populations grown in various growth media. We also examine the morphology of a minC mutant, which suggests an interpretation for the morphological types observed in wild type cells.

Effects of nanoparticles on phase morphology in thin films of phase-separated diblock copolymers

2017 ◽  
Vol 32 (S1) ◽  
pp. S141-S150
Author(s):  
Dieter Jehnichen ◽  
Doris Pospiech ◽  
Peter Friedel ◽  
Andriy Horechyy ◽  
Andreas Korwitz ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Diblock Copolymers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Gold Silver ◽  
Lateral Distance ◽  
Morphology Changes ◽  
Periodic Nanostructure

This study investigates the morphology changes in thin diblock copolymer (DiBCP) films occurring in the interaction with modified nanoparticles (NPs). Magnetite (Fe3O4) and silica (SiOx) were prepared and used. Poly(pentyl methacrylate-b-methyl methacrylate) (PPMA-b-PMMA) (70/30 mol mol−1, hcp cylinders of the PMMA phase) DiBCP were employed to prepare thin films having thicknesses to realize standing cylinders in pure DiBCP films. The investigations aimed at two topics: (1) morphology after controlled incorporation of organo-modified NP (gold, silver, Fe3O4, SiOx) and (2) additional solvent vapour annealing (SVA) with tetrahydrofuran (and chloroform for comparison). The laterally ordered morphology in thin films was examined by GISAXS and atomic force microscopy. Keeping the same type of morphology in nanocomposites, the dimensions of the periodic nanostructure altered depending on type and amount of incorporated NP. It was found that SiOx clusters enlarge the lateral distance of the PMMA cylinders, whereas metallic NPs reduce this parameter. Applying SVA improves the phase separation slightly, whereas lateral distances were kept constant or were reduced a little. Switching of domain orientation upon SVA could not be detected in the presence of NPs located at the polymer/substrate interface.

In Situ Atomic Force Microscopy of Pt/Ti film morphology changes on a microelectronic gas sensor operating at elevated temperatures

1995 ◽  
Vol 53 ◽  
pp. 254-255
Author(s):  
M. DiBattista ◽  
S. V. Patel ◽  
J. F. Mansfield ◽  
J. L. Gland ◽  
J. W. Schwank
Keyword(s):  
Atomic Force Microscopy ◽  
Elevated Temperatures ◽  
Film Surface ◽  
Film Structure ◽  
Film Morphology ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphology Changes ◽  
Ti Films

Thin film electronic devices that employ resistance change responses of Pt / Ti films to detect gas species have been microfabricated at the University of Michigan. Atomic force microscopy (AFM) is used to investigate morphology of the Pt / Ti sensing films deposited on the microfabricated device. These Pt / Ti sensing films are strongly influenced by many factors, making it difficult to determine the exact relationship between film structure, chemical sensitivity, and selectivity. In-situ AFM investigations of Pt / Ti films on this device at elevated temperatures provides the opportunity for real time observation of film morphology changes under controlled conditions, testing sensing film stability during device operation, and correlating film structure to resistance.Observation of the Pt / Ti film surface and in-situ resistance measurements at elevated temperatures are possible due to the construction of the sensing device. The sensors are based on chemically active thin films deposited on a micromachined silicon window, supported by a 300 μn thick silicon rim.

Atomic force microscopy studies on phase transitions and surface morphology transformation of CMTC crystals

2002 ◽  
Vol 75 (5) ◽  
pp. 617-620 ◽  
Author(s):  
X.N. Jiang ◽  
D. Xu ◽  
D.R. Yuan ◽  
D.L. Sun ◽  
M.K. Lu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Transitions ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force

Time‐dependent morphology changes in thin silver films on mica: A scaling analysis of atomic force microscopy results

1996 ◽  
Vol 105 (13) ◽  
pp. 5542-5551 ◽  
Author(s):  
David J. Semin ◽  
Alan Lo ◽  
Shane E. Roark ◽  
Rex T. Skodje ◽  
Kathy L. Rowlen
Keyword(s):  
Atomic Force Microscopy ◽  
Time Dependent ◽  
Scaling Analysis ◽  
Silver Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphology Changes

Monitoring high-temperature solid–solid phase transitions of HMX with atomic force microscopy

2002 ◽  
Vol 93 (1) ◽  
pp. 19-23 ◽  
Author(s):  
Brandon L Weeks ◽  
Chantel M Ruddle ◽  
Joseph M Zaug ◽  
Debra J Cook
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Transitions ◽  
High Temperature ◽  
Solid Phase ◽  
Force Microscopy ◽  
Atomic Force

In situ atomic force microscopy studies on lithium (de)intercalation-induced morphology changes in LixCoO2 micro-machined thin film electrodes

2013 ◽  
Vol 222 ◽  
pp. 417-425 ◽  
Author(s):  
Jonghyun Park ◽  
Sergiy Kalnaus ◽  
Sangwoo Han ◽  
Yoon Koo Lee ◽  
Gregory B. Less ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Film Electrodes ◽  
Morphology Changes
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