Adhesive Interaction between Polyelectrolyte Multilayers of Polyallylamine Hydrochloride and Polyacrylic Acid Studied Using Atomic Force Microscopy and Surface Force Apparatus

Langmuir ◽  
2009 ◽  
Vol 25 (5) ◽  
pp. 2887-2894 ◽  
Author(s):  
Erik Johansson ◽  
Eva Blomberg ◽  
Lars Wågberg
Keyword(s):  
Atomic Force Microscopy ◽  
Polyacrylic Acid ◽  
Surface Force ◽  
Polyelectrolyte Multilayers ◽  
Surface Force Apparatus ◽  
Adhesive Interaction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polyallylamine Hydrochloride

Visualization of Focused Proton Beam Dose Distribution by Atomic Force Microscopy Using Blended Polymer Films Based on Polyacrylic Acid

2012 ◽  
Vol 12 (9) ◽  
pp. 7401-7404 ◽  
Author(s):  
Masaaki Omichi ◽  
Katsuyoshi Takano ◽  
Takahiro Satoh ◽  
Tomihiro Kamiya ◽  
Yasuyuki Ishii ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Proton Beam ◽  
Polymer Films ◽  
Polyacrylic Acid ◽  
Dose Distribution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Blended Polymer ◽  
Beam Dose

MANIPULATION OF CARBON NANOTUBE BUNDLES WITH CONTACT MODE ATOMIC FORCE MICROSCOPY

2002 ◽  
Vol 01 (05n06) ◽  
pp. 575-579 ◽  
Author(s):  
ZIYONG SHEN ◽  
SAIJIN LIU ◽  
SHIMIN HOU ◽  
ZENGQUAN XUE ◽  
ZHENNAN GU
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Lateral Force ◽  
Force Load ◽  
Adhesive Interaction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Nanotube Bundles ◽  
Atomic Force ◽  
Optimal Force

The cutting and splitting of carbon nanotube bundles were realized with an atomic force microscopy (AFM) in contact mode. The results of manipulating were found depending on the tip–bundle interaction and bundle–substrate interaction. With an optimal force load of AFM tip, the lateral force applied on the nanotube bundle could overcome the adhesive interaction between nanotubes within the bundle, consequently separating individual nanotubes from the bundle. The threshold of the tip force load was found to be ~45 nN in our experiments. This technique provides new possibilities for the controllable manipulation of carbon nanotubes.

scholarly journals Interpreting motion and force for narrow-band intermodulation atomic force microscopy

2013 ◽  
Vol 4 ◽  
pp. 45-56 ◽  
Author(s):  
Daniel Platz ◽  
Daniel Forchheimer ◽  
Erik A Tholén ◽  
David B Haviland
Keyword(s):  
Atomic Force Microscopy ◽  
Narrow Band ◽  
Frequency Comb ◽  
Oscillation Amplitude ◽  
Surface Force ◽  
Amplitude Dependence ◽  
Band Frequency ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Components

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show, by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time-domain perspective, we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip–surface force that are in-phase with the tip motion (F I ) and quadrature to the motion (F Q ). Traditionally, these force components have been considered as a function of the static-probe height only. Here we show that F I and F Q actually depend on both static-probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of F I and F Q from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe-height dependence of the force components F I and F Q , providing deeper insight into the tip–surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.

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