Adsorption Isotherms and Structure of Cationic Surfactants Adsorbed on Mineral Oxide Surfaces Prepared by Atomic Layer Deposition

Langmuir ◽  
2013 ◽  
Vol 29 (48) ◽  
pp. 14748-14755 ◽  
Author(s):  
Thipvaree Wangchareansak ◽  
Vincent S. J. Craig ◽  
Shannon M. Notley
2019 ◽  
Vol 3 (15) ◽  
pp. 271-278 ◽  
Author(s):  
J. W. Elam ◽  
A. V. V. Zinovev ◽  
Michael J. Pellin ◽  
David J. Comstock ◽  
Mark C. Hersam

Nano Letters ◽  
2013 ◽  
Vol 13 (10) ◽  
pp. 4802-4809 ◽  
Author(s):  
Kenneth Hanson ◽  
Mark D. Losego ◽  
Berç Kalanyan ◽  
Gregory N. Parsons ◽  
Thomas J. Meyer

2001 ◽  
Vol 672 ◽  
Author(s):  
S. M. George ◽  
J.W. Elam ◽  
R.K. Grubbs ◽  
C.E. Nelson

ABSTRACTNucleation and growth has been studied during tungsten (W) atomic layer deposition (ALD) on oxide surfaces. Auger electron spectroscopy (AES) was utilized to examine the deposition of W during the sequential (A) WF6 and (B) Si2H6 reaction cycles that define W ALD. The AES results displayed an initial nucleation period of ∼10 AB cycles to deposit one tungsten monolayer on SiO2. Subsequently, the W and Si AES signals grew and oscillated dramatically versus WF6 and Si2H6 exposures. The increase in the W AES signal in the growth region was consistent with a W ALD growth rate of 3.5 Å per AB cycle. An examination of the oxygen and tungsten AES signals versus AB cycles indicated that W ALD displayed nearly ideal “layer-by-layer”, Frank- van der Merwe growth after the nucleation period. On Al2O3, the AES results displayed a much shorter nucleation period for W ALD. Only 3 AB cycles were required to deposit one tungsten monolayer. Subsequently, the tungsten film grew at a rate of 3.6 Å per AB cycle. The initial nucleation period and growth mechanism during ALD are important because they will affect the roughness of the resulting ALD film.


Langmuir ◽  
2019 ◽  
Vol 35 (17) ◽  
pp. 5762-5769 ◽  
Author(s):  
Jongyoon Bae ◽  
Izabela A. Samek ◽  
Peter C. Stair ◽  
Randall Q. Snurr

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