Electric-Field-Assisted Convective Assembly of Colloidal Crystal Coatings

Langmuir ◽  
2010 ◽  
Vol 26 (12) ◽  
pp. 10380-10385 ◽  
Author(s):  
Jairus Kleinert ◽  
Sejong Kim ◽  
Orlin D. Velev
Keyword(s):  
Electric Field ◽  
Colloidal Crystal ◽  
Convective Assembly

Colloidal Crystal Layers of Hexagonal Nanoplates by Convective Assembly

Langmuir ◽  
2006 ◽  
Vol 22 (12) ◽  
pp. 5217-5219 ◽  
Author(s):  
J. Alex Lee ◽  
Linli Meng ◽  
David J. Norris ◽  
L. E. Scriven ◽  
Michael Tsapatsis
Keyword(s):  
Colloidal Crystal ◽  
Convective Assembly ◽  
Hexagonal Nanoplates

scholarly journals Determination of Bulk Modulus for a Colloidal Crystal with Highly Charged Particles by DC Electric Field

2019 ◽  
Vol 123 (36) ◽  
pp. 7864-7871
Author(s):  
Linwei Wang ◽  
Shenghua Xu ◽  
Hongwei Zhou ◽  
Zhiwei Sun ◽  
Wenze Ouyang ◽  
...  
Keyword(s):  
Electric Field ◽  
Bulk Modulus ◽  
Colloidal Crystal ◽  
Charged Particles ◽  
Dc Electric Field

scholarly journals Isotropic compression of colloidal crystal in electric field between plate electrode

2013 ◽  
Vol 62 (17) ◽  
pp. 176105
Author(s):  
Li Xiao-Long ◽  
Lu Ying ◽  
Zhai Yong-Liang ◽  
Wu Lan-Sheng ◽  
Sun Wei ◽  
...  
Keyword(s):  
Electric Field ◽  
Colloidal Crystal ◽  
Plate Electrode ◽  
Isotropic Compression

Size dependent thermodynamics and kinetics in electric field mediated colloidal crystal assembly

Soft Matter ◽  
2013 ◽  
Vol 9 (38) ◽  
pp. 9208 ◽  
Author(s):  
Tara D. Edwards ◽  
Daniel J. Beltran-Villegas ◽  
Michael A. Bevan
Keyword(s):  
Electric Field ◽  
Colloidal Crystal ◽  
Size Dependent ◽  
Thermodynamics And Kinetics

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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