Measurement of the Surface Free Energy of Streptavidin Crystals by Atomic Force Microscopy

Langmuir ◽  
2003 ◽  
Vol 19 (7) ◽  
pp. 2908-2912 ◽  
Author(s):  
Annalisa Relini ◽  
Silvia Sottini ◽  
Simone Zuccotti ◽  
Martino Bolognesi ◽  
Alessandra Gliozzi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Free Energy ◽  
Surface Free Energy ◽  
Force Microscopy ◽  
Atomic Force

The effects of humidity and surface free energy on adhesion force between atomic force microscopy tip and a silane self-assembled monolayer film

2010 ◽  
Vol 25 (3) ◽  
pp. 556-562 ◽  
Author(s):  
Chien-Chao Huang ◽  
Lijiang Chen ◽  
Xiaohong Gu ◽  
Minhua Zhao ◽  
Tinh Nguyen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Free Energy ◽  
Surface Free Energy ◽  
Adhesion Force ◽  
Capillary Condensation ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Rate Of Increase ◽  
Self Assembled

The relationship between atomic force microscopy probe-sample adhesion force and relative humidity (RH) at five different levels of surface free energy (γs) of an organic self-assembled monolayer (SAM) has been investigated. Different γs levels were achieved by exposing a patterned SiO2/CH3-terminated octyldimethylchlorosilane SAM sample to an ultraviolet (UV)/ozone atmosphere. A model consisting of the Laplace-Kelvin theory for capillary condensation for nanosized probe and probe-sample molecular interaction was derived to describe the adhesion force as a function of RH from 25 to 90% for different SAM γs values. The equations were solved analytically by using an equivalent curvature of the probe tip shape. Experimental results show that the adhesion force increases slightly with RH for nonpolar SAM. However, for polar SAM surfaces, it increases at first, reaches a maximum, and then decreases. Both the rate of increase and the maximum of the adhesion force with humidity are γs-dependent, which is in good agreement with theoretical prediction. The large rise in the adhesion force in this RH range is due to the capillary force.

Determination of the Surface Free Energy of Crystalline and Amorphous Lactose by Atomic Force Microscopy Adhesion Measurement

2006 ◽  
Vol 23 (2) ◽  
pp. 401-407 ◽  
Author(s):  
Jianxin Zhang ◽  
Stephen Ebbens ◽  
Xinyong Chen ◽  
Zheng Jin ◽  
Shen Luk ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Free Energy ◽  
Surface Free Energy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Adhesion Measurement ◽  
Amorphous Lactose

Biopolymer Blends as Potential Biomaterials and Cosmetic Materials

2013 ◽  
Vol 583 ◽  
pp. 95-100 ◽  
Author(s):  
Alina Sionkowska ◽  
Katarzyna Lewandowska ◽  
A. Planecka ◽  
P. Szarszewska ◽  
K. Krasinska ◽  
...  
Keyword(s):  
Contact Angle ◽  
Free Energy ◽  
Surface Free Energy ◽  
Silk Fibroin ◽  
High Surface ◽  
Force Microscopy ◽  
Angle Measurements ◽  
Atomic Force ◽  
Polymeric Blends ◽  
Contact Angle Measurements

Blends of two polymer, namely chitosan with silk fibroin or partially hydrolysed polyacrylamide (HPAM) were prepared. The surface properties of chitosan/silk fibroin and chitosan/HPAM blended films were investigated using the technique of Atomic Force Microscopy (AFM) and by means of contact angle measurements allowing the calculation of surface free energy. Measurements of the contact angle for diiodomethane (D), and glycerol (G) on the surface of chitosan films and chitosan/silk fibroin films were made and surface free energy was calculated. It was found that chitosan/silk fibroin blend surface is enriched in high surface energy component i.e. silk fibroin. The surface roughness of chitosan, silk fibroin, HPAM, chitosan/silk fibroin and chitosan/HPAM blended films differs with the composition of the blend. Film-forming polymeric blends can be potentially used as biomaterials and cosmetic materials.

Free Energy Landscape and Dynamics of Supercoiled DNA by High-Speed Atomic Force Microscopy

ACS Nano ◽  
2018 ◽  
Vol 12 (12) ◽  
pp. 11907-11916 ◽  
Author(s):  
Tine Brouns ◽  
Herlinde De Keersmaecker ◽  
Sebastian F. Konrad ◽  
Noriyuki Kodera ◽  
Toshio Ando ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Free Energy ◽  
High Speed ◽  
Energy Landscape ◽  
Free Energy Landscape ◽  
Supercoiled Dna ◽  
Force Microscopy ◽  
Atomic Force

Surface Modification of Polyetheretherketone by Helium/nitrogen and Nitrous Oxide Plasma Enhanced Chemical Vapour Deposition

2014 ◽  
Vol 33 (2) ◽  
pp. 147-153
Author(s):  
Stanisława Kluska ◽  
Elżbieta Pamuła ◽  
Stanisława Jonas ◽  
Zbigniew Grzesik
Keyword(s):  
Free Energy ◽  
Surface Free Energy ◽  
Photoelectron Spectroscopy ◽  
Sessile Drop ◽  
Chemical Vapour ◽  
Chemical Vapor ◽  
Morphological Characterization ◽  
Polar Component ◽  
Force Microscopy ◽  
Atomic Force

AbstractThe surface of the polyetheretherketone (PEEK) samples was modified by the plasma enhanced chemical vapor deposition (PECVD) in the mixture of He and N2 as well as in the N2O atmosphere. Morphological characterization of the PEEK as well as its surface roughness, chemical structure, and surface free energy were investigated by atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and sessile drop technique, respectively. The highest increase in the polar component of the total surface energy was observed for PEEK modified by He+N2 plasma, which correlated with significant increase in the concentration of oxygen and nitrogen-containing chemical functionalities as revealed by XPS. For PEEK submitted to N2O plasma treatment significant changes in surface topography and increase in roughness were observed, but changes in surface chemistry and surface free energy were mild.

Free Energy Approaches for Modeling Atomic Force Microscopy in Liquids

2012 ◽  
Vol 9 (1) ◽  
pp. 600-608 ◽  
Author(s):  
Bernhard Reischl ◽  
Matthew Watkins ◽  
Adam S. Foster
Keyword(s):  
Atomic Force Microscopy ◽  
Free Energy ◽  
Force Microscopy ◽  
Atomic Force
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