Atomic Force Microscopy Studies of Salt Effects on Polyelectrolyte Multilayer Film Morphology

Langmuir ◽  
2001 ◽  
Vol 17 (21) ◽  
pp. 6655-6663 ◽  
Author(s):  
Richard A. McAloney ◽  
Mark Sinyor ◽  
Vyacheslav Dudnik ◽  
M. Cynthia Goh
Keyword(s):  
Atomic Force Microscopy ◽  
Multilayer Film ◽  
Film Morphology ◽  
Polyelectrolyte Multilayer ◽  
Salt Effects ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polyelectrolyte Multilayer Film

Kinetics of Salt-Induced Annealing of a Polyelectrolyte Multilayer Film Morphology

Langmuir ◽  
2003 ◽  
Vol 19 (9) ◽  
pp. 3947-3952 ◽  
Author(s):  
Richard A. McAloney ◽  
Vyacheslav Dudnik ◽  
M. Cynthia Goh
Keyword(s):  
Multilayer Film ◽  
Film Morphology ◽  
Polyelectrolyte Multilayer ◽  
Kinetics Of ◽  
Polyelectrolyte Multilayer Film

scholarly journals Statistical investigations of an ENIG Nickel film morphology by Atomic Force Microscopy

2016 ◽  
Vol 12 ◽  
pp. 04003
Author(s):  
Rosine Coq Germanicus ◽  
Philippe Leclère ◽  
Eric Hug ◽  
Florent Lallemand ◽  
Philippe Descamps
Keyword(s):  
Atomic Force Microscopy ◽  
Nickel Film ◽  
Film Morphology ◽  
Force Microscopy ◽  
Atomic Force

Effects of Alkali-Soluble Resin on Latex Film Morphology of Poly(n-butyl methacrylate) Studied by Atomic Force Microscopy

Langmuir ◽  
1998 ◽  
Vol 14 (19) ◽  
pp. 5419-5424 ◽  
Author(s):  
Young-Jun Park ◽  
Doug-Youn Lee ◽  
Mei-Ching Khew ◽  
Chee-Cheong Ho ◽  
Jung-Hyun Kim
Keyword(s):  
Atomic Force Microscopy ◽  
Latex Film ◽  
Butyl Methacrylate ◽  
Film Morphology ◽  
Force Microscopy ◽  
Atomic Force

In Situ Atomic Force Microscopy of Pt/Ti film morphology changes on a microelectronic gas sensor operating at elevated temperatures

1995 ◽  
Vol 53 ◽  
pp. 254-255
Author(s):  
M. DiBattista ◽  
S. V. Patel ◽  
J. F. Mansfield ◽  
J. L. Gland ◽  
J. W. Schwank
Keyword(s):  
Atomic Force Microscopy ◽  
Elevated Temperatures ◽  
Film Surface ◽  
Film Structure ◽  
Film Morphology ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphology Changes ◽  
Ti Films

Thin film electronic devices that employ resistance change responses of Pt / Ti films to detect gas species have been microfabricated at the University of Michigan. Atomic force microscopy (AFM) is used to investigate morphology of the Pt / Ti sensing films deposited on the microfabricated device. These Pt / Ti sensing films are strongly influenced by many factors, making it difficult to determine the exact relationship between film structure, chemical sensitivity, and selectivity. In-situ AFM investigations of Pt / Ti films on this device at elevated temperatures provides the opportunity for real time observation of film morphology changes under controlled conditions, testing sensing film stability during device operation, and correlating film structure to resistance.Observation of the Pt / Ti film surface and in-situ resistance measurements at elevated temperatures are possible due to the construction of the sensing device. The sensors are based on chemically active thin films deposited on a micromachined silicon window, supported by a 300 μn thick silicon rim.

Growth of C60 Fullerene Films on Semiconductor Surfaces

2003 ◽  
Vol 768 ◽  
Author(s):  
Elena V. Basiuk (Golovataya-Dzhymbeeva) ◽  
José G. Bañuelos ◽  
Alejandro Esparza ◽  
José M. Saniger
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Fourier Transform ◽  
Film Deposition ◽  
C60 Fullerene ◽  
Semiconductor Surfaces ◽  
Film Morphology ◽  
Force Microscopy ◽  
Atomic Force ◽  
Inp Surface

AbstractWe report on a study of vacuum-deposited thin films of C60 fullerene on Si (100) and InP (100) semiconductor surfaces. The film morphology and C60—substrate interactions were investigated by using atomic force microscopy (AFM) and Fourier transform infrared spectroscopy (FTIR). For the film deposition, both patterned Si aand InP surfaces were used. It was found that the stronger interactions occur between C60 molecules and Si surface, than between C60 molecules and InP surface. On InP surface with microrelief of parallel V-grooves oriented in [011] direction, C60 films grow preferentially above the groove walls, with C60 grains arrayed in the direction perpendicular to the groove axis.

Ultrathin Ruthenium(II) Complex–H4SiW12O40 Multilayer Film

2008 ◽  
Vol 8 (3) ◽  
pp. 1248-1253 ◽  
Author(s):  
Yu-Qi Zhang ◽  
Li-Hua Gao ◽  
Ke-Zhi Wang ◽  
Hong-Jun Gao ◽  
Ye-Liang Wang
Keyword(s):  
Atomic Force Microscopy ◽  
Cyclic Voltammetry ◽  
Photoelectron Spectroscopy ◽  
Self Assembly ◽  
Multilayer Film ◽  
Multilayer Films ◽  
Layer By Layer ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

A dipolar Ru(II) complex, [(bpy)2Ru(bpbh)Ru(bpy)2](ClO4)4 {where bpbh = 1,6-bis-[2-(2-pyridyl) benzimidazoyl]hexane, bpy = 2,2′-bipyridine}, was synthesized and characterized. A multilayer film of at least 18 layers was successfully prepared by alternating adsorption of H4SiW12O40 and [Ru2(bpy)4(bpbh)](ClO4)4 by electrostatic layer-by-layer self-assembly. The multilayer films were studied by ultraviolet-visible and X-ray photoelectron spectroscopy, atomic force microscopy, and cyclic voltammetry.

Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations

2008 ◽  
Vol 27 (4) ◽  
pp. 421-424 ◽  
Author(s):  
B. Gompf ◽  
D. Faltermeier ◽  
C. Redling ◽  
M. Dressel ◽  
J. Pflaum
Keyword(s):  
Atomic Force Microscopy ◽  
Film Morphology ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Fabrication and Properties of a Nanocomposite Multilayer Film Based on a Polyoxometalate

2012 ◽  
Vol 67 (7) ◽  
pp. 673-677
Author(s):  
Jihong Liu ◽  
Tao Dong ◽  
Shuang Li ◽  
Huiyuan Ma ◽  
Bo Liu
Keyword(s):  
Atomic Force Microscopy ◽  
Self Assembly ◽  
Multilayer Film ◽  
Color Change ◽  
Layer By Layer ◽  
Force Microscopy ◽  
Assembly Method ◽  
Atomic Force ◽  
Good Electrocatalytic Activity ◽  
Vis Spectroscopy

A nanocomposite multilayer film based on a polyoxometalate Na16[P4W30Mn4 (H2O)2O112]·xH2O (Mn4P4W30) was fabricated by the layer-by-layer self-assembly method. It was characterized by UV/Vis spectra and atomic force microscopy (AFM). The electrochromic and electrocatalytic properties were explored using chronoamperometry (CA), UV/Vis spectroscopy and cyclovoltammetry (CV). The attractable feature is a color change of the film by the reduction of the polyoxometalate at different potentials. The film also exhibits good electrocatalytic activity toward the reduction of IO3-.

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