Study of Elastic Modulus and Yield Strength of Polymer Thin Films Using Atomic Force Microscopy

Langmuir ◽  
2001 ◽  
Vol 17 (11) ◽  
pp. 3286-3291 ◽  
Author(s):  
Binyang Du ◽  
Ophelia K. C. Tsui ◽  
Qingling Zhang ◽  
Tianbai He
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Elastic Modulus ◽  
Yield Strength ◽  
Polymer Thin Films ◽  
Force Microscopy ◽  
Atomic Force

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Atomic force microscopy study of small-size nanotubular polymer thin films

1999 ◽  
Vol 14 (3) ◽  
pp. 1084-1090 ◽  
Author(s):  
C. F. Zhu ◽  
I. Lee ◽  
J. W. Li ◽  
C. Wang ◽  
X. Y. Cao ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Dynamics ◽  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Polymer Thin Films ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force

In this paper, we report atomic force microscopy (AFM) images of a tubular polymer and its supermolecular polymer thin films, operated in contact mode at room temperature in air. The configuration models are also calculated using molecular dynamics. The diameter of the polymer nanotube is about 0.7 nm, the smallest size a tube can have. The results of calculation agree with the experimental results.

Noncontact Viscoelastic Measurement of Polymer Thin Films in a Liquid Medium Using Long-Needle Atomic Force Microscopy

Langmuir ◽  
2017 ◽  
Vol 33 (6) ◽  
pp. 1385-1390 ◽  
Author(s):  
Dongshi Guan ◽  
Chloé Barraud ◽  
Elisabeth Charlaix ◽  
Penger Tong
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Liquid Medium ◽  
Polymer Thin Films ◽  
Force Microscopy ◽  
Atomic Force

Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy

2006 ◽  
Vol 38 (4) ◽  
pp. 842-846 ◽  
Author(s):  
Daniel Franta ◽  
Ivan Ohlídal ◽  
Petr Klapetek ◽  
Růžena Nepustilová ◽  
Svatopluk Bajer
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Optical Method ◽  
Polymer Thin Films ◽  
Aluminum Films ◽  
Force Microscopy ◽  
Atomic Force

Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy

2009 ◽  
Vol 24 (9) ◽  
pp. 2960-2964 ◽  
Author(s):  
Gheorghe Stan ◽  
Sean W. King ◽  
Robert F. Cook
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Elastic Modulus ◽  
Picosecond Laser ◽  
Dielectric Films ◽  
Dielectric Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Applied Forces ◽  
Contact Resonance

Correlated force and contact resonance versus displacement responses have been resolved using load-dependent contact-resonance atomic force microscopy (AFM) to determine the elastic modulus of low-k dielectric thin films. The measurements consisted of recording simultaneously both the deflection and resonance frequency shift of an AFM cantilever probe as the probe was gradually brought in and out of contact. As the applied forces were restricted to the range of adhesive forces, low-k dielectric films of elastic modulus varying from GPa to hundreds of GPa were measurable in this investigation. Over this elastic modulus range, the reliability of load-dependent contact-resonance AFM measurements was confirmed by comparing these results with those from picosecond laser acoustic measurements.

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