Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy

2006 ◽  
Vol 38 (4) ◽  
pp. 842-846 ◽  
Author(s):  
Daniel Franta ◽  
Ivan Ohlídal ◽  
Petr Klapetek ◽  
Růžena Nepustilová ◽  
Svatopluk Bajer
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Optical Method ◽  
Polymer Thin Films ◽  
Aluminum Films ◽  
Force Microscopy ◽  
Atomic Force

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

2012 ◽  
Vol 405 (5) ◽  
pp. 1463-1478 ◽  
Author(s):  
Daniele Passeri ◽  
Marco Rossi ◽  
Emanuela Tamburri ◽  
Maria Letizia Terranova
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Mechanical Characterization ◽  
Polymeric Thin Films ◽  
Force Microscopy ◽  
Atomic Force

Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

2004 ◽  
Vol 20-21 ◽  
pp. 611-616
Author(s):  
José M. Barandiarán ◽  
Iñaki Orue ◽  
M.L. Fdez-Gubieda ◽  
A. García Prieto
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Force Microscopy ◽  
Atomic Force

Analysis of inhomogeneous thin films of ZrO2by the combined optical method and atomic force microscopy

2001 ◽  
Vol 32 (1) ◽  
pp. 91-94 ◽  
Author(s):  
D. Franta ◽  
I. Ohlídal ◽  
P. Klapetek ◽  
P. Pokorný ◽  
M. Ohlídal
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Optical Method ◽  
Force Microscopy ◽  
Atomic Force
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