Scanning probe lithography. 1. Scanning tunneling microscope induced lithography of self-assembled n-alkanethiol monolayer resists

Langmuir ◽  
1993 ◽  
Vol 9 (3) ◽  
pp. 632-636 ◽  
Author(s):  
Claudia B. Ross ◽  
Li Sun ◽  
Richard M. Crooks
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Scanning Probe Lithography ◽  
Tunneling Microscope ◽  
Self Assembled

Scanning Probe Lithography. 2. Selective Chemical Vapor Deposition of Copper into Scanning Tunneling Microscope-Defined Patterns

Langmuir ◽  
1994 ◽  
Vol 10 (3) ◽  
pp. 615-618 ◽  
Author(s):  
Jonathan K. Schoer ◽  
Claudia B. Ross ◽  
Richard M. Crooks ◽  
Thomas S. Corbitt ◽  
Mark J. Hampden-Smith
Keyword(s):  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Scanning Tunneling Microscope ◽  
Chemical Vapor ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Scanning Probe Lithography ◽  
Tunneling Microscope ◽  
Selective Chemical

scholarly journals Scanning Tunneling Microscope Investigation of Self-Assembled Rosette Nanotubes on Highly Ordered Pyrolytic Graphite

2010 ◽  
Vol 16 (S2) ◽  
pp. 470-471 ◽  
Author(s):  
J-Y Cho ◽  
G Borzsonyi ◽  
H Fenniri
Keyword(s):  
Scanning Tunneling Microscope ◽  
Pyrolytic Graphite ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Microscope Investigation ◽  
Rosette Nanotubes ◽  
Highly Ordered Pyrolytic Graphite ◽  
Self Assembled

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Low voltage electron beam lithography in self‐assembled ultrathin films with the scanning tunneling microscope

1994 ◽  
Vol 64 (3) ◽  
pp. 390-392 ◽  
Author(s):  
C. R. K. Marrian ◽  
F. K. Perkins ◽  
S. L. Brandow ◽  
T. S. Koloski ◽  
E. A. Dobisz ◽  
...  
Keyword(s):  
Electron Beam ◽  
Ultrathin Films ◽  
Electron Beam Lithography ◽  
Scanning Tunneling Microscope ◽  
Low Voltage ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Voltage Electron ◽  
Self Assembled

Making Gold Nanostructures Using Self-Assembled Monolayers and a Scanning Tunneling Microscope

1997 ◽  
Vol 101 (45) ◽  
pp. 9263-9269 ◽  
Author(s):  
E. Delamarche ◽  
A. C. F. Hoole ◽  
B. Michel ◽  
S. Wilkes ◽  
M. Despont ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Gold Nanostructures ◽  
Self Assembled Monolayers ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Assembled Monolayers ◽  
Self Assembled

Application of various modes of scanning-probe microscopies in polymer systems

1996 ◽  
Vol 54 ◽  
pp. 196-197
Author(s):  
Dale J. Meier
Keyword(s):  
Scanning Tunneling Microscope ◽  
Molecular Level ◽  
Contact Forces ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Nanometer Scale ◽  
Polymer Systems ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Cantilever Probe

The invention of the scanning tunneling microscope (STM) by Binnig and Rohrer in 1982 demonstrated an unparalleled ability to image materials at the sub-nanometer scale. The invention rapidly lead to an explosion of applications of STM in a wide variety of fields. However, imaging by an STM is essentially limited to materials which are conductive, or could be made conductive, so many materials of interest could not be imaged by STM. This limitation was removed a few years later (1985) by the invention of the atomic force microscope (AFM) by Binnig, Quate and Gerber, in which imaging is based on the response of a soft cantilever beam to the contact forces between an ultra-fine probe tip and a sample. The cantilever/probe systems could be made sensitive enough to enable the AFM to easily resolve atomic or molecular level features.

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