Surface Potential Map of Charged Ionomer-Polymer Blends Studied with a Scanning Kelvin Probe

Langmuir ◽  
1994 ◽  
Vol 10 (2) ◽  
pp. 597-601 ◽  
Author(s):  
M. T. Nguyen ◽  
K. Keiji Kanazawa ◽  
P. Brock ◽  
A. F. Diaz ◽  
Shelgon Yee
Keyword(s):  
Polymer Blends ◽  
Surface Potential ◽  
Kelvin Probe ◽  
Scanning Kelvin Probe ◽  
Potential Map

Investigation Of Blister Formed On Coated Mild Steel Using Scanning Kelvin Probe

2012 ◽  
Author(s):  
Zalilah Sharer Sahir ◽  
John Malcolm Sykes
Keyword(s):  
Mild Steel ◽  
Key Words ◽  
Ammonium Chloride ◽  
Chloride Solution ◽  
Organic Coating ◽  
Kelvin Probe ◽  
Scanning Kelvin Probe ◽  
Coated Metal ◽  
Potential Map ◽  
Electrochemical Potentials

Degradasi pada besi bersalut cat dari segi gelembung yang terbentuk telah dikaji selepas direndam di dalam larutan 3% natrium klorida dan 3% ammonium klorida. Imbasan probe Kelvin (SKP) telah digunakan untuk menghasilkan peta keupayaan kimia–elektro bagi mengenal pasti kawasan anod dan katod dibawah gelembung dan kawasan persekitarannya. Bagi gelembung yang terhasil pada panel yang direndam dalam larutan 3% sodium klorida, peta upaya SKP menunjukkan gelembung yang terbentuk adalah di kawasan katod yang disebabkan oleh alkali, dimana kawasan anod juga dilihat terbentuk berdekatan. Walhal bagi peta upaya SKP untuk gelembung yang terhasil pada panel yang direndam di dalam larutan 3% ammonium klorida menunjukkan kehadiran kawasan katod dikelilingi oleh kawasan anod. Kata kunci: Cat organik; imbasan probe Kelvin; gelembung The degradation of a coated metal in term of the area underneath a blister has been studied after being immersed in 3% sodium chlorida and 3% ammonium chloride solution. Scanning Kelvin probe (SKP) was used to map electrochemical potentials, identifying anodic and cathodic regions underneath a blister and the surrounding coating. For blisters formed on coated panel immersed in sodium chlorida solution, SKP potential map reveals that the blister has formed at a cathode due to alkali but anodes form nearby (not remote). Meanwhile SKP potential map for blister formed on coated panel in 3% ammonium chloride reveals the presence of cathodic regions within the anodic areas. Key words: Organic coating; scanning Kelvin Probe; blister

Scanning Kelvin Probe Microscopy on Bulk Heterojunction Polymer Blends

2009 ◽  
Vol 19 (9) ◽  
pp. 1379-1386 ◽  
Author(s):  
Klára Maturová ◽  
Martijn Kemerink ◽  
Martijn M. Wienk ◽  
Dimitri S. H. Charrier ◽  
René A. J. Janssen
Keyword(s):  
Polymer Blends ◽  
Bulk Heterojunction ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe

Surface Potential and Surface Photovoltage of Oxide and Nitride coated multicrystalline Silicon Solar Cells using a Scanning Kelvin Probe

2004 ◽  
Vol 808 ◽  
Author(s):  
Iain D. Baikie
Keyword(s):  
Solar Cells ◽  
Surface Potential ◽  
Multicrystalline Silicon ◽  
Surface Photovoltage ◽  
Silicon Solar Cells ◽  
Electrical Characteristics ◽  
Nitride Coating ◽  
Kelvin Probe ◽  
Thin Coatings ◽  
Scanning Kelvin Probe

ABSTRACTWe have applied a high resolution scanning Kelvin probe to perform dark surface potential topographies of multicrystalline silicon solar cells having thin coatings of Si3N4 and SiO2. We clearly observe the electrical characteristics of the screen printed bus-bar and associated fingers, grain boundaries, together with characteristic structures on the oxide and nitride, coupled to significant surface potential variations across larger sections of the wafer. Associated surface photovoltage measurements can be unambiguously decoded to show coating and bulk contributions. The nitride coating exhibits carrier trapping lifetimes in excess of 13 minutes at 300K.

scholarly journals Surface potential imaging of CNT-FET devices by scanning Kelvin probe microscopy

2008 ◽  
Vol 100 (5) ◽  
pp. 052085 ◽  
Author(s):  
H Hosoi ◽  
M Nakamura ◽  
Y Yamada ◽  
K Sueoka ◽  
K Mukasa
Keyword(s):  
Surface Potential ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe
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