The Complex Interaction of Spectroscopic Shifts and Electronic Properties in Semiconductor Nanocrystal Films

2013 ◽  
Vol 4 (4) ◽  
pp. 625-632 ◽  
Author(s):  
Edward E. Foos
2020 ◽  
Vol 124 (44) ◽  
pp. 24351-24360
Author(s):  
Stephen L. Gibbs ◽  
Corey M. Staller ◽  
Ankit Agrawal ◽  
Robert W. Johns ◽  
Camila A. Saez Cabezas ◽  
...  

Nano Letters ◽  
2012 ◽  
Vol 12 (11) ◽  
pp. 5903-5906 ◽  
Author(s):  
Maximilian J. Berr ◽  
Florian F. Schweinberger ◽  
Markus Döblinger ◽  
Kai E. Sanwald ◽  
Christian Wolff ◽  
...  

2002 ◽  
Vol 80 (1) ◽  
pp. 4-6 ◽  
Author(s):  
Congjun Wang ◽  
Moonsub Shim ◽  
Philippe Guyot-Sionnest

Nanoscale ◽  
2018 ◽  
Vol 10 (17) ◽  
pp. 8042-8057 ◽  
Author(s):  
Willi Aigner ◽  
Oliver Bienek ◽  
Bruno P. Falcão ◽  
Safwan U. Ahmed ◽  
Hartmut Wiggers ◽  
...  

The exploitation of semiconductor nanocrystal (NC) films in novel electronic and optoelectronic applications requires a better understanding of charge transport in these systems.


2012 ◽  
Vol 86 (7) ◽  
Author(s):  
Stefan Kudera ◽  
Yang Zhang ◽  
Enzo Di Fabrizio ◽  
Liberato Manna ◽  
Roman Krahne

2008 ◽  
Vol 104 (5) ◽  
pp. 053701 ◽  
Author(s):  
Robert Lechner ◽  
Andre R. Stegner ◽  
Rui N. Pereira ◽  
Roland Dietmueller ◽  
Martin S. Brandt ◽  
...  

Author(s):  
J.M. Bonar ◽  
R. Hull ◽  
R. Malik ◽  
R. Ryan ◽  
J.F. Walker

In this study we have examined a series of strained heteropeitaxial GaAs/InGaAs/GaAs and InGaAs/GaAs structures, both on (001) GaAs substrates. These heterostructures are potentially very interesting from a device standpoint because of improved band gap properties (InAs has a much smaller band gap than GaAs so there is a large band offset at the InGaAs/GaAs interface), and because of the much higher mobility of InAs. However, there is a 7.2% lattice mismatch between InAs and GaAs, so an InxGa1-xAs layer in a GaAs structure with even relatively low x will have a large amount of strain, and misfit dislocations are expected to form above some critical thickness. We attempt here to correlate the effect of misfit dislocations on the electronic properties of this material.The samples we examined consisted of 200Å InxGa1-xAs layered in a hetero-junction bipolar transistor (HBT) structure (InxGa1-xAs on top of a (001) GaAs buffer, followed by more GaAs, then a layer of AlGaAs and a GaAs cap), and a series consisting of a 200Å layer of InxGa1-xAs on a (001) GaAs substrate.


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