Energetics of the Nanocrystalline Titanium Dioxide/Aqueous Solution Interface:  Approximate Conduction Band Edge Variations between H0= −10 and H-= +26

1999 ◽  
Vol 103 (22) ◽  
pp. 4623-4628 ◽  
Author(s):  
L. Andrew Lyon ◽  
Joseph T. Hupp
Keyword(s):  
Aqueous Solution ◽  
Titanium Dioxide ◽  
Conduction Band ◽  
Band Edge ◽  
Conduction Band Edge ◽  
Solution Interface ◽  
H 26 ◽  
Nanocrystalline Titanium ◽  
Nanocrystalline Titanium Dioxide

scholarly journals Conduction-band-edge ionization thresholds of DNA components in aqueous solution

1998 ◽  
Vol 95 (10) ◽  
pp. 5550-5555 ◽  
Author(s):  
H. Fernando ◽  
G. A. Papadantonakis ◽  
N. S. Kim ◽  
P. R. LeBreton
Keyword(s):  
Aqueous Solution ◽  
Conduction Band ◽  
Band Edge ◽  
Conduction Band Edge ◽  
Dna Components

scholarly journals Conduction Band Edge Energy Profile Probed by Hall Offset Voltage in InGaZnO Thin Films

Micromachines ◽  
2020 ◽  
Vol 11 (9) ◽  
pp. 822
Author(s):  
Hyo-Jun Joo ◽  
Dae-Hwan Kim ◽  
Hyun-Seok Cha ◽  
Sang-Hun Song
Keyword(s):  
Magnetic Field ◽  
Electron Density ◽  
Conduction Band ◽  
Electron System ◽  
Band Edge ◽  
Conduction Band Edge ◽  
Offset Voltage ◽  
Three Samples ◽  
Dimensional Electron System ◽  
Longitudinal Distance

We measured and analyzed the Hall offset voltages in InGaZnO thin-film transistors. The Hall offset voltages were found to decrease monotonously as the electron densities increased. We attributed the magnitude of the offset voltage to the misalignment in the longitudinal distance between the probing points and the electron density to Fermi energy of the two-dimensional electron system, which was verified by the coincidence of the Hall voltage with the perpendicular magnetic field in the tilted magnetic field. From these results, we deduced the combined conduction band edge energy profiles from the Hall offset voltages with the electron density variations for three samples with different threshold voltages. The extracted combined conduction band edge varied by a few tens of meV over a longitudinal distance of a few tenths of µm. This result is in good agreement with the value obtained from the analysis of percolation conduction.

Sign in / Sign up

Export Citation Format

Share Document