Characterization of the RuS2(100) Surface by Scanning Tunneling Microscopy, Atomic Force Microscopy, and Near-Edge X-ray Absorption Fine Structure Measurements and Electronic Band Structure Calculations

1999 ◽  
Vol 103 (22) ◽  
pp. 4649-4655 ◽  
Author(s):  
S. P. Kelty ◽  
J. Li ◽  
J. G. Chen ◽  
R. R. Chianelli ◽  
J. Ren ◽  
...  
Keyword(s):  
Electronic Band Structure ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Electronic Band ◽  
Force Microscopy ◽  
Atomic Force ◽  
Band Structure Calculations ◽  
X Ray Absorption ◽  
Structure Calculations

Heterogeneous Oxidation and Precipitation of Aqueous Mn(II) at the Goethite Surface: A SPM Study

1998 ◽  
Vol 4 (S2) ◽  
pp. 600-601
Author(s):  
John Rakovan ◽  
F. Hochella Michael
Keyword(s):  
Lateral Force ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Mineral Surfaces ◽  
Tunneling Microscopy ◽  
Heterogeneous Oxidation ◽  
Force Microscopy ◽  
Solution Interface ◽  
Atomic Force

Since its invention inl982 scanning probe microscopy (SPM) has become an important analytical tool in every branch of physical science. The two most widely used types of SPM are atomic force Microscopy (AFM) and scanning tunneling microscopy (STM). Both AFM and STM allow measurement of the microtopography of a surface down to the atomic scale. Many spin-off applications such as lateral force and magnetic force allow measurement of a variety of the physical properties of a surface while imaging its microtopography. SPM can be done in both air and liquid and hence can be used to observe the interactions that take place at a solid-solution interface.SPM has been used in mineralogy and geochemistry since 1989. Here as in other applications the great strength of SPM is in the characterization of the heterogeneous nature of mineral surfaces and the ability to observe many geochemical processes in real time.

Structure and Morphology of Tetracene Thin Films on Hydrogen-Terminated Si(001)

2006 ◽  
Vol 965 ◽  
Author(s):  
X. R. Qin ◽  
A. Tersigni ◽  
J. Shi ◽  
D. T. Jiang
Keyword(s):  
Structural Phase ◽  
Film Structure ◽  
Scanning Tunneling ◽  
Growth Morphology ◽  
Tunneling Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystalline Substrate ◽  
X Ray Absorption

ABSTRACTScanning tunneling microscopy (STM), atomic force microscopy (AFM) and near-edge x-ray absorption fine structure (NEXAFS) have been used to study the structure of tetracene films on hydrogen-passivated Si(001). A distinct growth morphology change that occurs around a few monolayers of film thickness was characterized. This coverage-dependent film structural phase transition leads to a molecularly ordered film structure commensurate with the crystalline substrate.

Characterization of InP/GaInAs Nanometer Sized Columns Produced by Aerosol Deposition and Plasma Etching

1994 ◽  
Vol 332 ◽  
Author(s):  
I. Maximov ◽  
K. Deppert ◽  
L. Montelius ◽  
L. Samuelson ◽  
S. Gray ◽  
...  
Keyword(s):  
Plasma Etching ◽  
Electron Cyclotron Resonance ◽  
Average Diameter ◽  
Aerosol Deposition ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ag Particles

ABSTRACTWe present a technique for the fabrication of InP nano-columns and GaInAs/InP quantum-dots based on the use of sintered aerosol Ag particles as a mask in an electron cyclotron resonance etching process. The sintered particles have much more regular shapes than the unsintered ones used in previous studies and are more resistant to the etching environment, which results in the formation of more regular and reproducible structures. For example, we have been able to produce columns 100 nm in height which have an average diameter of 24 nm and a density of 109 cm−2.We have investigated the shape of the etched columns as a function of the Ag particles’ size, and characterized their electrical and optical properties using a combination of scanning electron microscopy, scanning tunneling microscopy, atomic force microscopy, and photoluminescence.

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