Simulations of Aberration-Corrected High-Resolution Transmission Electron Microscope Images for Carbyne Chains

Yun Hang Hu

doi:10.1021/jp905810k

Simulations of Aberration-Corrected High-Resolution Transmission Electron Microscope Images for Carbyne Chains

The Journal of Physical Chemistry C ◽

10.1021/jp905810k ◽

2009 ◽

Vol 113 (41) ◽

pp. 17751-17754 ◽

Cited By ~ 3

Author(s):

Yun Hang Hu

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Microscope Images ◽

Aberration Corrected

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Restoring defect structures in 3C-SiC/Si (001) from spherical aberration-corrected high-resolution transmission electron microscope images by means of deconvolution processing

Micron ◽

10.1016/j.micron.2014.12.008 ◽

2015 ◽

Vol 71 ◽

pp. 22-31 ◽

Cited By ~ 6

Author(s):

C. Wen ◽

W. Wan ◽

F.H. Li ◽

D. Tang

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Spherical Aberration ◽

Defect Structures ◽

Transmission Electron ◽

Microscope Images ◽

Aberration Corrected

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Faculty Opinions recommendation of High-resolution imaging with an aberration-corrected transmission electron microscope.

Faculty Opinions – Post-Publication Peer Review of the Biomedical Literature ◽

10.3410/f.1009425.126407 ◽

2002 ◽

Author(s):

Eaton E Lattman

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

High Resolution Imaging ◽

Transmission Electron ◽

Resolution Imaging ◽

Aberration Corrected

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Impact of dynamical scattering on quantitative contrast for aberration-corrected transmission electron microscope images

Micron ◽

10.1016/j.micron.2016.07.008 ◽

2016 ◽

Vol 89 ◽

pp. 77-86 ◽

Cited By ~ 2

Author(s):

C. Wen ◽

David J. Smith

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Microscope Images ◽

Aberration Corrected

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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities

Microscopy and Microanalysis ◽

10.1017/s143192761600101x ◽

2016 ◽

Vol 22 (S3) ◽

pp. 32-33 ◽

Cited By ~ 1

Author(s):

H. Inada ◽

Y. Taniguchi ◽

T. Yotsuji ◽

Y. Hirayama ◽

T. Dobashi ◽

...

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

High Resolution Imaging ◽

Transmission Electron ◽

Resolution Imaging ◽

Aberration Corrected

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Computer simulation of high‐resolution transmission electron microscope images based on ball‐and‐spoke models of (100) Si/SiO2interface

Journal of Applied Physics ◽

10.1063/1.337563 ◽

1986 ◽

Vol 60 (11) ◽

pp. 3900-3904 ◽

Cited By ~ 12

Author(s):

Iwao Ohdomari ◽

Tohru Mihara ◽

Kazuhiko Kai

Keyword(s):

Computer Simulation ◽

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Microscope Images

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Direct Imaging of the MoVTeNbO M1 Phase Using An Aberration-Corrected High-Resolution Scanning Transmission Electron Microscope

Angewandte Chemie ◽

10.1002/ange.200705700 ◽

2008 ◽

Vol 120 (15) ◽

pp. 2830-2833 ◽

Cited By ~ 26

Author(s):

William D. Pyrz ◽

Douglas A. Blom ◽

Thomas Vogt ◽

Douglas J. Buttrey

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

M1 Phase ◽

Direct Imaging ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities

European Microscopy Congress 2016: Proceedings ◽

10.1002/9783527808465.emc2016.5987 ◽

2016 ◽

pp. 334-335

Author(s):

Hiromi Inada ◽

Yoshifumi Taniguchi ◽

Takafumi Yotsuji ◽

Keitaro Watanabe ◽

Hirobumi Muto ◽

...

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

High Resolution Imaging ◽

Transmission Electron ◽

Resolution Imaging ◽

Aberration Corrected

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Analysis of high resolution transmission electron microscope images of crystalline–amorphous interfaces

Ultramicroscopy ◽

10.1016/s0304-3991(01)00153-x ◽

2002 ◽

Vol 90 (4) ◽

pp. 241-258 ◽

Cited By ~ 14

Author(s):

N.I. Borgardt ◽

B. Plikat ◽

M. Seibt ◽

W. Schröter

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Transmission Electron ◽

Microscope Images

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Interpretation of High Resolution Scanning Transmission Electron Microscope Images Based on Core Loss Spectroscopy

Microscopy and Microanalysis ◽

10.1017/s1431927605504525 ◽

2005 ◽

Vol 11 (S02) ◽

Author(s):

M P Oxley ◽

S D Findlay ◽

L J Allen

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Core Loss ◽

Scanning Transmission Electron Microscope ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Microscope Images ◽

Scanning Transmission

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Signal processing of high-resolution transmission electron microscope images using Fourier transforms

Acta Crystallographica Section A Foundations of Crystallography ◽

10.1107/s0108767388007500 ◽

1988 ◽

Vol 44 (6) ◽

pp. 975-986 ◽

Cited By ~ 7

Author(s):

P. R. Buseck ◽

Y. Epelboin ◽

A. Rimsky

Keyword(s):

Signal Processing ◽

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Fourier Transforms ◽

Transmission Electron ◽

Microscope Images

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