Organic Depth Profiling of a Binary System: the Compositional Effect on Secondary Ion Yield and a Model for Charge Transfer during Secondary Ion Emission

2009 ◽  
Vol 113 (34) ◽  
pp. 11574-11582 ◽  
Author(s):  
Alexander G. Shard ◽  
Ali Rafati ◽  
Ryosuke Ogaki ◽  
Joanna L. S. Lee ◽  
Simon Hutton ◽  
...  
Keyword(s):  
Charge Transfer ◽  
Binary System ◽  
Depth Profiling ◽  
Compositional Effect ◽  
Secondary Ion Emission ◽  
Ion Emission ◽  
Secondary Ion

Charge transfer in secondary-ion emission: Tight-binding studies in Si and Si:O clusters

1987 ◽  
Vol 35 (16) ◽  
pp. 8330-8340 ◽  
Author(s):  
M. C. G. Passeggi ◽  
E. C. Goldberg ◽  
J. Ferrón
Keyword(s):  
Charge Transfer ◽  
Tight Binding ◽  
Binding Studies ◽  
Secondary Ion Emission ◽  
Ion Emission ◽  
Secondary Ion

Secondary ion emission of selected transition metals under nitrogen oxides

1990 ◽  
Vol 102 (1-3) ◽  
pp. 71-78 ◽  
Author(s):  
Margarete M. Brudny ◽  
Wolfgang Rybczynski ◽  
Wolfhart Seidel ◽  
Dieter Thiel
Keyword(s):  
Nitrogen Oxides ◽  
Transition Metals ◽  
Secondary Ion Emission ◽  
Ion Emission ◽  
Secondary Ion

Mechanisms of secondary ion emission from self-assembled monolayers and multilayers

2005 ◽  
Vol 37 (9) ◽  
pp. 721-730 ◽  
Author(s):  
Stephen C. C. Wong ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Self Assembled Monolayers ◽  
Secondary Ion Emission ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Ion Emission ◽  
Secondary Ion

Secondary ion emission from UHV-deposited amino acid overlayers on metals

1984 ◽  
Vol 136 (2-3) ◽  
pp. A14
Author(s):  
W. Lange ◽  
M. Jirikowsky ◽  
A. Benninghoven
Keyword(s):  
Amino Acid ◽  
Secondary Ion Emission ◽  
Ion Emission ◽  
Secondary Ion
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