Necessity of a Thorough Characterization of Functionalized Silicon Wafers before Biointerface Studies

2011 ◽  
Vol 115 (22) ◽  
pp. 11102-11111 ◽  
Author(s):  
Judith Böhmler ◽  
Lydie Ploux ◽  
Vincent Ball ◽  
Karine Anselme ◽  
Arnaud Ponche
Keyword(s):  
Silicon Wafers

Nondestructive Photoelastic and Machine Learning Characterization of Surface Cracks and Prediction of Weibull Parameters for Photovoltaic Silicon Wafers

2021 ◽  
pp. 1-40
Author(s):  
Logan Rowe ◽  
Alexander J. Kaczkowski ◽  
Tung-Wei Lin ◽  
Gavin Horn ◽  
Harley Johnson
Keyword(s):  
Machine Learning ◽  
Learning Algorithm ◽  
Tensile Load ◽  
Silicon Wafers ◽  
Uniaxial Tensile ◽  
Support Vector ◽  
Weibull Parameters ◽  
Bulk Stress ◽  
Wire Motion

Abstract A nondestructive photoelastic method is presented for characterizing surface microcracks in monocrystalline silicon wafers, calculating the strength of the wafers, and predicting Weibull parameters under various loading conditions. Defects are first classified from through thickness infrared photoelastic images using a support vector machine learning algorithm. Characteristic wafer strength is shown to vary with the angle of applied uniaxial tensile load, showing greater strength when loaded perpendicular to the direction of wire motion than when loaded along the direction of wire motion. Observed variations in characteristic strength and Weibull shape modulus with applied tensile loading direction stem from the distribution of crack orientations and the bulk stress field acting on the microcracks. Using this method it is possible to improve manufacturing processes for silicon wafers by rapidly, accurately, and nondestructively characterizing large batches in an automated way.

Characterization of silicon wafers through deposition of self-assembled monolayers

2000 ◽  
Vol 368 (5) ◽  
pp. 434-438 ◽  
Author(s):  
B. Basnar ◽  
J. Schnöller ◽  
K. Föttinger ◽  
G. Friedbacher ◽  
U. Mayer ◽  
...  
Keyword(s):  
Silicon Wafers ◽  
Self Assembled Monolayers ◽  
Assembled Monolayers ◽  
Self Assembled

Photoluminescence Characterization of Interface Quality of Bonded Silicon Wafers

2015 ◽  
Vol 5 (4) ◽  
pp. P3064-P3068 ◽  
Author(s):  
Woo Sik Yoo ◽  
Toshikazu Ishigaki ◽  
Kitaek Kang
Keyword(s):  
Silicon Wafers ◽  
Interface Quality

Characterization of polycrystalline silicon wafers for solar cells sliced with novel fixed-abrasive wire

2010 ◽  
Vol 18 (7) ◽  
pp. 485-490 ◽  
Author(s):  
N. Watanabe ◽  
Y. Kondo ◽  
D. Ide ◽  
T. Matsuki ◽  
H. Takato ◽  
...  
Keyword(s):  
Solar Cells ◽  
Polycrystalline Silicon ◽  
Silicon Wafers ◽  
Fixed Abrasive
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